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X-RAY DIFFRACTION
Materials and Methods page
4HOR
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 295.15
    Details pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 295.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.59 α = 90
    b = 84.9 β = 106.92
    c = 61.47 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 105
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU SATURN 944+
    Collection Date 2012-07-15
     
    Diffraction Radiation
    Monochromator Varimax HF
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 1.68
    Resolution(High) 1.86
    Resolution(Low) 50
    Number Reflections(All) 45025
    Number Reflections(Observed) 45025
    Percent Possible(Observed) 95.5
     
    High Resolution Shell Details
    Resolution(High) 1.86
    Resolution(Low) 1.93
    Percent Possible(All) 86.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.861
    Resolution(Low) 29.563
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 46145
    Number of Reflections(Observed) 42808
    Number of Reflections(R-Free) 3337
    Percent Reflections(Observed) 95.03
    R-Factor(Observed) 0.167
    R-Work 0.164
    R-Free 0.2009
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8605
    Shell Resolution(Low) 1.8871
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 1400
    R-Factor(R-Work) 0.2706
    R-Factor(R-Free) 0.3049
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8871
    Shell Resolution(Low) 1.9153
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 1529
    R-Factor(R-Work) 0.2199
    R-Factor(R-Free) 0.292
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9153
    Shell Resolution(Low) 1.9452
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 1538
    R-Factor(R-Work) 0.2043
    R-Factor(R-Free) 0.2601
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9452
    Shell Resolution(Low) 1.9771
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1602
    R-Factor(R-Work) 0.2142
    R-Factor(R-Free) 0.2793
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9771
    Shell Resolution(Low) 2.0112
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 1546
    R-Factor(R-Work) 0.2068
    R-Factor(R-Free) 0.2494
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0112
    Shell Resolution(Low) 2.0477
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1647
    R-Factor(R-Work) 0.1686
    R-Factor(R-Free) 0.23
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0477
    Shell Resolution(Low) 2.0871
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1642
    R-Factor(R-Work) 0.1646
    R-Factor(R-Free) 0.2318
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0871
    Shell Resolution(Low) 2.1297
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 1642
    R-Factor(R-Work) 0.1586
    R-Factor(R-Free) 0.2293
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1297
    Shell Resolution(Low) 2.176
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1652
    R-Factor(R-Work) 0.1524
    R-Factor(R-Free) 0.211
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.176
    Shell Resolution(Low) 2.2266
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1665
    R-Factor(R-Work) 0.1559
    R-Factor(R-Free) 0.2038
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2266
    Shell Resolution(Low) 2.2822
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1670
    R-Factor(R-Work) 0.1571
    R-Factor(R-Free) 0.218
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2822
    Shell Resolution(Low) 2.3439
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 1622
    R-Factor(R-Work) 0.1678
    R-Factor(R-Free) 0.2097
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3439
    Shell Resolution(Low) 2.4129
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1660
    R-Factor(R-Work) 0.1637
    R-Factor(R-Free) 0.2124
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4129
    Shell Resolution(Low) 2.4907
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1683
    R-Factor(R-Work) 0.1708
    R-Factor(R-Free) 0.2192
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4907
    Shell Resolution(Low) 2.5797
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1662
    R-Factor(R-Work) 0.1721
    R-Factor(R-Free) 0.2444
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5797
    Shell Resolution(Low) 2.6829
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1683
    R-Factor(R-Work) 0.1789
    R-Factor(R-Free) 0.234
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6829
    Shell Resolution(Low) 2.8049
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 1691
    R-Factor(R-Work) 0.1768
    R-Factor(R-Free) 0.2036
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8049
    Shell Resolution(Low) 2.9527
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 1670
    R-Factor(R-Work) 0.188
    R-Factor(R-Free) 0.2225
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9527
    Shell Resolution(Low) 3.1375
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 1653
    R-Factor(R-Work) 0.1948
    R-Factor(R-Free) 0.2382
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1375
    Shell Resolution(Low) 3.3794
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1687
    R-Factor(R-Work) 0.1798
    R-Factor(R-Free) 0.2277
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3794
    Shell Resolution(Low) 3.7189
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1722
    R-Factor(R-Work) 0.1559
    R-Factor(R-Free) 0.18
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7189
    Shell Resolution(Low) 4.2557
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1710
    R-Factor(R-Work) 0.1417
    R-Factor(R-Free) 0.1622
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2557
    Shell Resolution(Low) 5.3565
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1710
    R-Factor(R-Work) 0.1352
    R-Factor(R-Free) 0.159
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3565
    Shell Resolution(Low) 29.5671
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1785
    R-Factor(R-Work) 0.1367
    R-Factor(R-Free) 0.1378
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.071
    f_dihedral_angle_d 14.651
    f_angle_d 1.03
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3937
    Nucleic Acid Atoms 93
    Heterogen Atoms 1
    Solvent Atoms 425
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection HKL-2000