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X-RAY DIFFRACTION
Materials and Methods page
4HOQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 277.15
    Details pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 277.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 64.15 α = 90
    b = 71.43 β = 90
    c = 117.56 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 105
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-01-01
     
    Diffraction Radiation
    Monochromator double crystal monochromator (DCM) with an indirectly cryo-cooled first crystal and sagittally focusing second crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CLSI BEAMLINE 08ID-1
    Wavelength List 0.979
    Site CLSI
    Beamline 08ID-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2
    Resolution(Low) 50
    Number Reflections(All) 37620
    Number Reflections(Observed) 37620
    Percent Possible(Observed) 96.1
     
    High Resolution Shell Details
    Resolution(High) 2.07
    Resolution(Low) 2.14
    Percent Possible(All) 78.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.07
    Resolution(Low) 37.051
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 33178
    Number of Reflections(Observed) 31276
    Number of Reflections(R-Free) 1902
    Percent Reflections(Observed) 92.99
    R-Factor(All) 0.1683
    R-Factor(Observed) 0.1683
    R-Work 0.1654
    R-Free 0.2128
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0702
    Shell Resolution(Low) 2.1219
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 1539
    R-Factor(R-Work) 0.2156
    R-Factor(R-Free) 0.2935
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1219
    Shell Resolution(Low) 2.1793
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 1715
    R-Factor(R-Work) 0.2005
    R-Factor(R-Free) 0.3121
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1793
    Shell Resolution(Low) 2.2434
    Number of Reflections(R-Free) 103
    Number of Reflections(R-Work) 1887
    R-Factor(R-Work) 0.1935
    R-Factor(R-Free) 0.2579
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2434
    Shell Resolution(Low) 2.3158
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 1996
    R-Factor(R-Work) 0.1907
    R-Factor(R-Free) 0.2617
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3158
    Shell Resolution(Low) 2.3986
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2080
    R-Factor(R-Work) 0.1821
    R-Factor(R-Free) 0.2316
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3986
    Shell Resolution(Low) 2.4946
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2086
    R-Factor(R-Work) 0.1806
    R-Factor(R-Free) 0.2488
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4946
    Shell Resolution(Low) 2.6081
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2188
    R-Factor(R-Work) 0.1694
    R-Factor(R-Free) 0.2615
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6081
    Shell Resolution(Low) 2.7455
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2191
    R-Factor(R-Work) 0.1805
    R-Factor(R-Free) 0.2543
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7455
    Shell Resolution(Low) 2.9175
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2209
    R-Factor(R-Work) 0.1773
    R-Factor(R-Free) 0.2116
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9175
    Shell Resolution(Low) 3.1426
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2201
    R-Factor(R-Work) 0.1735
    R-Factor(R-Free) 0.2112
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1426
    Shell Resolution(Low) 3.4587
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2260
    R-Factor(R-Work) 0.171
    R-Factor(R-Free) 0.2179
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4587
    Shell Resolution(Low) 3.9587
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2296
    R-Factor(R-Work) 0.1416
    R-Factor(R-Free) 0.1822
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9587
    Shell Resolution(Low) 4.9856
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2300
    R-Factor(R-Work) 0.1398
    R-Factor(R-Free) 0.1707
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9856
    Shell Resolution(Low) 37.0574
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2426
    R-Factor(R-Work) 0.1559
    R-Factor(R-Free) 0.1756
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.071
    f_dihedral_angle_d 13.994
    f_angle_d 0.944
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3896
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 258
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHELXS
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building SHELXS
    data collection HKL-2000