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X-RAY DIFFRACTION
Materials and Methods page
4HN9
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 297.0
    Details 35% PEG4000, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 297K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 61.87 α = 90
    b = 57.56 β = 98.2
    c = 79.3 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2012-10-10
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97923
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.85
    Resolution(Low) 30
    Number Reflections(All) 47314
    Number Reflections(Observed) 47253
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.084
    B(Isotropic) From Wilson Plot 22.9
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 1.85
    Resolution(Low) 1.88
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.724
    Mean I Over Sigma(Observed) 1.98
    Redundancy 3.7
    Number Unique Reflections(All) 2354
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.85
    Resolution(Low) 30.012
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 47227
    Number of Reflections(Observed) 47227
    Number of Reflections(R-Free) 1212
    Percent Reflections(Observed) 99.78
    R-Factor(All) 0.1509
    R-Factor(Observed) 0.1509
    R-Work 0.1496
    R-Free 0.1982
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model isotropic
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.85
    Shell Resolution(Low) 1.9241
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 5091
    R-Factor(R-Work) 0.1918
    R-Factor(R-Free) 0.218
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9241
    Shell Resolution(Low) 2.0116
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 5027
    R-Factor(R-Work) 0.1839
    R-Factor(R-Free) 0.2417
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0116
    Shell Resolution(Low) 2.1177
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 5133
    R-Factor(R-Work) 0.1698
    R-Factor(R-Free) 0.2375
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1177
    Shell Resolution(Low) 2.2503
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 5079
    R-Factor(R-Work) 0.1623
    R-Factor(R-Free) 0.2503
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2503
    Shell Resolution(Low) 2.424
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 5102
    R-Factor(R-Work) 0.1546
    R-Factor(R-Free) 0.1987
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.424
    Shell Resolution(Low) 2.6678
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 5113
    R-Factor(R-Work) 0.1532
    R-Factor(R-Free) 0.2178
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6678
    Shell Resolution(Low) 3.0535
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 5125
    R-Factor(R-Work) 0.1554
    R-Factor(R-Free) 0.2251
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0535
    Shell Resolution(Low) 3.8458
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 5143
    R-Factor(R-Work) 0.1394
    R-Factor(R-Free) 0.1732
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8458
    Shell Resolution(Low) 30.0157
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 5202
    R-Factor(R-Work) 0.1322
    R-Factor(R-Free) 0.1625
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.087
    f_dihedral_angle_d 13.103
    f_angle_d 1.395
    f_bond_d 0.014
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4826
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 280
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCcollect
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution Phenix, Shelxd, Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building Phaser
    model building Shelxd
    model building Phenix
    data collection SBCcollect