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X-RAY DIFFRACTION
Materials and Methods page
4HN6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 298.0
    Details 15 % PEG 2000 MME, 6 % glycerol, 0.1M HEPES pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 38.74 α = 90
    b = 87.87 β = 90
    c = 103.15 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2011-12-09
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.00
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.55
    Resolution(Low) 44.5
    Number Reflections(All) 11685
    Number Reflections(Observed) 11685
    Percent Possible(Observed) 96.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.549
    Resolution(Low) 44.479
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 11685
    Number of Reflections(Observed) 11669
    Number of Reflections(R-Free) 1167
    Percent Reflections(Observed) 96.61
    R-Factor(All) 0.1954
    R-Factor(Observed) 0.2006
    R-Work 0.1954
    R-Free 0.2478
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.549
    Shell Resolution(Low) 2.6648
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 1112
    R-Factor(R-Work) 0.324
    R-Factor(R-Free) 0.3681
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6648
    Shell Resolution(Low) 2.8053
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1225
    R-Factor(R-Work) 0.2819
    R-Factor(R-Free) 0.3342
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8053
    Shell Resolution(Low) 2.981
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1316
    R-Factor(R-Work) 0.2701
    R-Factor(R-Free) 0.3605
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.981
    Shell Resolution(Low) 3.2111
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1335
    R-Factor(R-Work) 0.2343
    R-Factor(R-Free) 0.2741
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2111
    Shell Resolution(Low) 3.5341
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1336
    R-Factor(R-Work) 0.1916
    R-Factor(R-Free) 0.2448
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5341
    Shell Resolution(Low) 4.0453
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1345
    R-Factor(R-Work) 0.1751
    R-Factor(R-Free) 0.2515
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0453
    Shell Resolution(Low) 5.0954
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1375
    R-Factor(R-Work) 0.1597
    R-Factor(R-Free) 0.2043
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0954
    Shell Resolution(Low) 44.486
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 1458
    R-Factor(R-Work) 0.1525
    R-Factor(R-Free) 0.1816
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.075
    f_dihedral_angle_d 24.164
    f_angle_d 1.302
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1102
    Nucleic Acid Atoms 650
    Heterogen Atoms 4
    Solvent Atoms 43
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SER-GUI
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser-MR
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building Phaser-MR
    data collection SER-GUI