X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 298.0
Details 15 % PEG 2000 MME, 6 % glycerol, 0.1M HEPES pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 38.74 α = 90
b = 87.87 β = 90
c = 103.15 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2011-12-09
Diffraction Radiation
Monochromator Protocol
Si 111 CHANNEL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 1.00 APS 22-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.55 44.5 96.8 -- -- -- -- 11685 11685 0.0 0.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.549 44.479 -- 1.35 11685 11669 1167 96.61 0.1954 0.2006 0.1954 0.2478 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.549 2.6648 -- 123 1112 0.324 0.3681 -- 83.0
X Ray Diffraction 2.6648 2.8053 -- 137 1225 0.2819 0.3342 -- 93.0
X Ray Diffraction 2.8053 2.981 -- 147 1316 0.2701 0.3605 -- 99.0
X Ray Diffraction 2.981 3.2111 -- 148 1335 0.2343 0.2741 -- 100.0
X Ray Diffraction 3.2111 3.5341 -- 148 1336 0.1916 0.2448 -- 99.0
X Ray Diffraction 3.5341 4.0453 -- 149 1345 0.1751 0.2515 -- 100.0
X Ray Diffraction 4.0453 5.0954 -- 153 1375 0.1597 0.2043 -- 100.0
X Ray Diffraction 5.0954 44.486 -- 162 1458 0.1525 0.1816 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.075
f_dihedral_angle_d 24.164
f_angle_d 1.302
f_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1102
Nucleic Acid Atoms 650
Heterogen Atoms 4
Solvent Atoms 43

Software

Computing
Computing Package Purpose
SER-GUI Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser-MR Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
Phaser-MR model building
SER-GUI data collection