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X-RAY DIFFRACTION
Materials and Methods page
4HN5
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 298.0
    Details 15 % PEG 20000, 6 % glycerol, 7.5 % ethanol, 0.1M HEPES pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 39.35 α = 90
    b = 96.57 β = 90
    c = 104 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2012-03-16
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.00
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.9
    Resolution(Low) 50
    Number Reflections(All) 31815
    Number Reflections(Observed) 31815
    Percent Possible(Observed) 99.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.902
    Resolution(Low) 26.011
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 31815
    Number of Reflections(Observed) 31783
    Number of Reflections(R-Free) 2009
    Percent Reflections(Observed) 99.46
    R-Factor(All) 0.2074
    R-Factor(Observed) 0.2091
    R-Work 0.2074
    R-Free 0.2346
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.902
    Shell Resolution(Low) 1.95
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1985
    R-Factor(R-Work) 0.2902
    R-Factor(R-Free) 0.314
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.95
    Shell Resolution(Low) 2.0027
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2089
    R-Factor(R-Work) 0.2725
    R-Factor(R-Free) 0.3
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0027
    Shell Resolution(Low) 2.0616
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2123
    R-Factor(R-Work) 0.2483
    R-Factor(R-Free) 0.2772
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0616
    Shell Resolution(Low) 2.1281
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2075
    R-Factor(R-Work) 0.2185
    R-Factor(R-Free) 0.2809
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1281
    Shell Resolution(Low) 2.2041
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2130
    R-Factor(R-Work) 0.2147
    R-Factor(R-Free) 0.3137
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2041
    Shell Resolution(Low) 2.2923
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2094
    R-Factor(R-Work) 0.2298
    R-Factor(R-Free) 0.2824
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2923
    Shell Resolution(Low) 2.3966
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2119
    R-Factor(R-Work) 0.2134
    R-Factor(R-Free) 0.2608
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3966
    Shell Resolution(Low) 2.5228
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2128
    R-Factor(R-Work) 0.2111
    R-Factor(R-Free) 0.2638
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5228
    Shell Resolution(Low) 2.6807
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2143
    R-Factor(R-Work) 0.2153
    R-Factor(R-Free) 0.2666
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6807
    Shell Resolution(Low) 2.8875
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2124
    R-Factor(R-Work) 0.2179
    R-Factor(R-Free) 0.2532
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8875
    Shell Resolution(Low) 3.1776
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2145
    R-Factor(R-Work) 0.2164
    R-Factor(R-Free) 0.2136
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1776
    Shell Resolution(Low) 3.6363
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2150
    R-Factor(R-Work) 0.1973
    R-Factor(R-Free) 0.2425
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6363
    Shell Resolution(Low) 4.5773
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2175
    R-Factor(R-Work) 0.1846
    R-Factor(R-Free) 0.1943
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5773
    Shell Resolution(Low) 26.0135
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2294
    R-Factor(R-Work) 0.1976
    R-Factor(R-Free) 0.2059
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.066
    f_dihedral_angle_d 22.839
    f_angle_d 1.146
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1113
    Nucleic Acid Atoms 650
    Heterogen Atoms 4
    Solvent Atoms 162
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SER_GUI
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser-MR
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building Phaser-MR
    data collection SER_GUI