X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 298.0
Details 15 % PEG 20000, 6 % glycerol, 7.5 % ethanol, 0.1M HEPES pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 39.35 α = 90
b = 96.57 β = 90
c = 104 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2012-03-16
Diffraction Radiation
Monochromator Protocol
Si 111 CHANNEL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 1.00 APS 22-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 50 99.5 -- -- -- -- 31815 31815 0.0 0.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.902 26.011 -- 1.34 31815 31783 2009 99.46 0.2074 0.2091 0.2074 0.2346 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.902 1.95 -- 149 1985 0.2902 0.314 -- 95.0
X Ray Diffraction 1.95 2.0027 -- 138 2089 0.2725 0.3 -- 100.0
X Ray Diffraction 2.0027 2.0616 -- 133 2123 0.2483 0.2772 -- 100.0
X Ray Diffraction 2.0616 2.1281 -- 146 2075 0.2185 0.2809 -- 100.0
X Ray Diffraction 2.1281 2.2041 -- 141 2130 0.2147 0.3137 -- 100.0
X Ray Diffraction 2.2041 2.2923 -- 141 2094 0.2298 0.2824 -- 100.0
X Ray Diffraction 2.2923 2.3966 -- 141 2119 0.2134 0.2608 -- 100.0
X Ray Diffraction 2.3966 2.5228 -- 140 2128 0.2111 0.2638 -- 100.0
X Ray Diffraction 2.5228 2.6807 -- 142 2143 0.2153 0.2666 -- 100.0
X Ray Diffraction 2.6807 2.8875 -- 150 2124 0.2179 0.2532 -- 100.0
X Ray Diffraction 2.8875 3.1776 -- 140 2145 0.2164 0.2136 -- 100.0
X Ray Diffraction 3.1776 3.6363 -- 142 2150 0.1973 0.2425 -- 99.0
X Ray Diffraction 3.6363 4.5773 -- 152 2175 0.1846 0.1943 -- 100.0
X Ray Diffraction 4.5773 26.0135 -- 154 2294 0.1976 0.2059 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.066
f_dihedral_angle_d 22.839
f_angle_d 1.146
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1113
Nucleic Acid Atoms 650
Heterogen Atoms 4
Solvent Atoms 162

Software

Computing
Computing Package Purpose
SER_GUI Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser-MR Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
Phaser-MR model building
SER_GUI data collection