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X-RAY DIFFRACTION
Materials and Methods page
4HLU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5
    Temperature 277.0
    Details 100mM sodium acetate, 30% MPD, 200mM sodium chloride, pH 5.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 67.79 α = 90
    b = 67.79 β = 90
    c = 252.51 γ = 120
     
    Space Group
    Space Group Name:    P 32
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 180
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2012-07-24
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.7
    Resolution(Low) 48.15
    Number Reflections(All) 36024
    Number Reflections(Observed) 35999
    Percent Possible(Observed) 99.9
    B(Isotropic) From Wilson Plot 54.1
    Redundancy 11.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.7003
    Resolution(Low) 48.15
    Cut-off Sigma(F) 2.01
    Number of Reflections(all) 36024
    Number of Reflections(Observed) 35599
    Number of Reflections(R-Free) 1758
    Percent Reflections(Observed) 99.93
    R-Factor(Observed) 0.2155
    R-Work 0.2133
    R-Free 0.2583
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.5047
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.5047
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.4938
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7003
    Shell Resolution(Low) 2.7733
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.3227
    R-Factor(R-Free) 0.3872
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7733
    Shell Resolution(Low) 2.8549
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.299
    R-Factor(R-Free) 0.3469
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8549
    Shell Resolution(Low) 2.947
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.2819
    R-Factor(R-Free) 0.339
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.947
    Shell Resolution(Low) 3.0523
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2545
    R-Factor(R-Work) 0.28
    R-Factor(R-Free) 0.3164
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0523
    Shell Resolution(Low) 3.1745
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2607
    R-Factor(R-Work) 0.2737
    R-Factor(R-Free) 0.3245
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1745
    Shell Resolution(Low) 3.319
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.2561
    R-Factor(R-Free) 0.2896
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.319
    Shell Resolution(Low) 3.4939
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.2362
    R-Factor(R-Free) 0.2807
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4939
    Shell Resolution(Low) 3.7127
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.2076
    R-Factor(R-Free) 0.2496
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7127
    Shell Resolution(Low) 3.9992
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.1945
    R-Factor(R-Free) 0.2108
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9992
    Shell Resolution(Low) 4.4015
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2556
    R-Factor(R-Work) 0.1764
    R-Factor(R-Free) 0.2258
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4015
    Shell Resolution(Low) 5.0378
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1762
    R-Factor(R-Free) 0.2173
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0378
    Shell Resolution(Low) 6.3448
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.2188
    R-Factor(R-Free) 0.2445
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3448
    Shell Resolution(Low) 48.1572
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.1715
    R-Factor(R-Free) 0.2446
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.07
    f_dihedral_angle_d 18.042
    f_angle_d 1.133
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8119
    Nucleic Acid Atoms 0
    Heterogen Atoms 128
    Solvent Atoms 89
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building Phaser
    data collection HKL-2000