X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5
Temperature 277.0
Details 100mM sodium acetate, 30% MPD, 200mM sodium chloride, pH 5.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 67.79 α = 90
b = 67.79 β = 90
c = 252.51 γ = 120
Symmetry
Space Group P 32

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 180
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2012-07-24
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.075 NSLS X29A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 48.15 99.9 -- 0.078 -- 11.5 36024 35999 2.0 2.0 54.1

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.7003 48.15 -- 2.01 36024 35599 1758 99.93 -- 0.2155 0.2133 0.2583 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.7003 2.7733 -- 138 2589 0.3227 0.3872 -- 100.0
X Ray Diffraction 2.7733 2.8549 -- 128 2619 0.299 0.3469 -- 100.0
X Ray Diffraction 2.8549 2.947 -- 144 2664 0.2819 0.339 -- 100.0
X Ray Diffraction 2.947 3.0523 -- 122 2545 0.28 0.3164 -- 100.0
X Ray Diffraction 3.0523 3.1745 -- 136 2607 0.2737 0.3245 -- 100.0
X Ray Diffraction 3.1745 3.319 -- 138 2602 0.2561 0.2896 -- 100.0
X Ray Diffraction 3.319 3.4939 -- 136 2601 0.2362 0.2807 -- 100.0
X Ray Diffraction 3.4939 3.7127 -- 130 2619 0.2076 0.2496 -- 100.0
X Ray Diffraction 3.7127 3.9992 -- 138 2631 0.1945 0.2108 -- 100.0
X Ray Diffraction 3.9992 4.4015 -- 144 2556 0.1764 0.2258 -- 100.0
X Ray Diffraction 4.4015 5.0378 -- 129 2609 0.1762 0.2173 -- 100.0
X Ray Diffraction 5.0378 6.3448 -- 142 2600 0.2188 0.2445 -- 100.0
X Ray Diffraction 6.3448 48.1572 -- 133 2599 0.1715 0.2446 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 1.5047
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.5047
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 3.4938
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 18.042
f_bond_d 0.007
f_plane_restr 0.004
f_chiral_restr 0.07
f_angle_d 1.133
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8119
Nucleic Acid Atoms 0
Heterogen Atoms 128
Solvent Atoms 89

Software

Software
Software Name Purpose
HKL-2000 data collection
PHASER phasing
PHENIX refinement version: (phenix.refine: 1.7.3_928)
HKL-2000 data reduction
HKL-2000 data scaling