X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4.5
Temperature 277.0
Details 0.1M sodium acetate pH 4.5, 0.8M di-potassium hydrogen phospate, 0.8M sodium dihydrogen phosphate, 0.025M beryllium fluoride, VAPOR DIFFUSION, HANGING DROP, temperature 277.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 73.55 α = 90
b = 73.55 β = 90
c = 113 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD PSI PILATUS 6M -- 2011-10-30
CCD PSI PILATUS 6M -- 2011-10-09
Diffraction Radiation
Monochromator Protocol
Si(111) CHANNEL SINGLE WAVELENGTH
Si(111) CHANNEL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.9786 SLS X10SA
SYNCHROTRON SLS BEAMLINE X10SA 0.9793 SLS X10SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50 99.9 -- -- -- -- 18695 18508 0.0 -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.3 99.9 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.2 42.27 -3.0 0.0 18508 17582 926 100.0 -- 0.20425 0.20259 0.23489 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2 2.257 -- 66 1255 0.215 0.265 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 64.211
Anisotropic B[1][1] 3.34
Anisotropic B[1][2] 1.67
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 3.34
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -5.0
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 4.883
r_scbond_it 3.144
r_mcangle_it 2.032
r_mcbond_it 1.142
r_gen_planes_refined 0.01
r_chiral_restr 0.123
r_dihedral_angle_4_deg 26.61
r_dihedral_angle_3_deg 17.948
r_dihedral_angle_2_deg 36.732
r_dihedral_angle_1_deg 6.542
r_angle_refined_deg 1.867
r_bond_refined_d 0.022
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2220
Nucleic Acid Atoms 0
Heterogen Atoms 12
Solvent Atoms 45

Software

Computing
Computing Package Purpose
XDS Data Collection
XDS Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
SOLVE Structure Solution
REFMAC 5.5.0102 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.5.0102 refinement
SOLVE model building
XDS data collection