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X-RAY DIFFRACTION
Materials and Methods page
4HL4
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.5
    Temperature 277.0
    Details 0.1M sodium acetate pH 4.5, 0.8M di-potassium hydrogen phospate, 0.8M sodium dihydrogen phosphate, 0.025M beryllium fluoride, VAPOR DIFFUSION, HANGING DROP, temperature 277.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.55 α = 90
    b = 73.55 β = 90
    c = 113 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
    Diffrn ID 2
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type PSI PILATUS 6M
    Collection Date 2011-10-30
    Detector CCD
    Type PSI PILATUS 6M
    Collection Date 2011-10-09
     
    Diffraction Radiation
    Monochromator Si(111) CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
    Monochromator Si(111) CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength List 0.9786
    Site SLS
    Beamline X10SA
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength List 0.9793
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.2
    Resolution(Low) 50
    Number Reflections(All) 18695
    Number Reflections(Observed) 18508
    Percent Possible(Observed) 99.9
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.3
    Percent Possible(All) 99.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.2
    Resolution(Low) 42.27
    Cut-off Sigma(I) -3.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 18508
    Number of Reflections(Observed) 17582
    Number of Reflections(R-Free) 926
    Percent Reflections(Observed) 100.0
    R-Factor(Observed) 0.20425
    R-Work 0.20259
    R-Free 0.23489
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 64.211
    Anisotropic B[1][1] 3.34
    Anisotropic B[1][2] 1.67
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 3.34
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -5.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2
    Shell Resolution(Low) 2.257
    Number of Reflections(R-Free) 66
    Number of Reflections(R-Work) 1255
    R-Factor(R-Work) 0.215
    R-Factor(R-Free) 0.265
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 4.883
    r_scbond_it 3.144
    r_mcangle_it 2.032
    r_mcbond_it 1.142
    r_gen_planes_refined 0.01
    r_chiral_restr 0.123
    r_dihedral_angle_4_deg 26.61
    r_dihedral_angle_3_deg 17.948
    r_dihedral_angle_2_deg 36.732
    r_dihedral_angle_1_deg 6.542
    r_angle_refined_deg 1.867
    r_bond_refined_d 0.022
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2220
    Nucleic Acid Atoms 0
    Heterogen Atoms 12
    Solvent Atoms 45
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution SOLVE
    Structure Refinement REFMAC 5.5.0102
     
    Software
    refinement REFMAC version: 5.5.0102
    model building SOLVE
    data collection XDS