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X-RAY DIFFRACTION
Materials and Methods page
4HL2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.5
    Temperature 289.0
    Details 0.2 M ammonium sulphate, 0.1 M Bis-Tris pH 5.5, 25 %(w/v) PEG 3350, 100 mM ampicillin, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 39.19 α = 90
    b = 79.17 β = 90
    c = 134.47 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2011-08-15
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.5166
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.05
    Resolution(Low) 50
    Number Reflections(All) 185255
    Number Reflections(Observed) 185255
    Percent Possible(Observed) 94.9
    B(Isotropic) From Wilson Plot 7.76
    Redundancy 5.5
     
    High Resolution Shell Details
    Resolution(High) 1.05
    Resolution(Low) 1.06
    Percent Possible(All) 88.9
    Mean I Over Sigma(Observed) 0.871
    R-Sym I(Observed) 0.023
    Redundancy 5.7
    Number Unique Reflections(All) 5746
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.05
    Resolution(Low) 17.561
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 184744
    Number of Reflections(Observed) 184744
    Number of Reflections(R-Free) 9286
    Percent Reflections(Observed) 94.65
    R-Factor(All) 0.134
    R-Factor(Observed) 0.134
    R-Work 0.133
    R-Free 0.157
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 11.8
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0503
    Shell Resolution(Low) 1.0623
    Number of Reflections(Observed) 5646
    Number of Reflections(R-Free) 288
    Number of Reflections(R-Work) 5358
    R-Factor(R-Work) 0.2106
    R-Factor(R-Free) 0.2496
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0623
    Shell Resolution(Low) 1.0748
    Number of Reflections(Observed) 5723
    Number of Reflections(R-Free) 275
    Number of Reflections(R-Work) 5448
    R-Factor(R-Work) 0.1918
    R-Factor(R-Free) 0.2151
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0748
    Shell Resolution(Low) 1.0879
    Number of Reflections(Observed) 5787
    Number of Reflections(R-Free) 274
    Number of Reflections(R-Work) 5513
    R-Factor(R-Work) 0.1817
    R-Factor(R-Free) 0.2035
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0879
    Shell Resolution(Low) 1.1017
    Number of Reflections(Observed) 5775
    Number of Reflections(R-Free) 300
    Number of Reflections(R-Work) 5475
    R-Factor(R-Work) 0.1705
    R-Factor(R-Free) 0.1946
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1017
    Shell Resolution(Low) 1.1161
    Number of Reflections(Observed) 5823
    Number of Reflections(R-Free) 318
    Number of Reflections(R-Work) 5505
    R-Factor(R-Work) 0.1569
    R-Factor(R-Free) 0.1787
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1161
    Shell Resolution(Low) 1.1314
    Number of Reflections(Observed) 5797
    Number of Reflections(R-Free) 280
    Number of Reflections(R-Work) 5517
    R-Factor(R-Work) 0.1499
    R-Factor(R-Free) 0.1609
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1314
    Shell Resolution(Low) 1.1476
    Number of Reflections(Observed) 5829
    Number of Reflections(R-Free) 312
    Number of Reflections(R-Work) 5517
    R-Factor(R-Work) 0.1507
    R-Factor(R-Free) 0.1712
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1476
    Shell Resolution(Low) 1.1647
    Number of Reflections(Observed) 5859
    Number of Reflections(R-Free) 296
    Number of Reflections(R-Work) 5563
    R-Factor(R-Work) 0.1471
    R-Factor(R-Free) 0.1591
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1647
    Shell Resolution(Low) 1.1829
    Number of Reflections(Observed) 5896
    Number of Reflections(R-Free) 286
    Number of Reflections(R-Work) 5610
    R-Factor(R-Work) 0.1388
    R-Factor(R-Free) 0.1743
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1829
    Shell Resolution(Low) 1.2023
    Number of Reflections(Observed) 5881
    Number of Reflections(R-Free) 282
    Number of Reflections(R-Work) 5599
    R-Factor(R-Work) 0.1421
    R-Factor(R-Free) 0.1692
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2023
    Shell Resolution(Low) 1.223
    Number of Reflections(Observed) 5943
    Number of Reflections(R-Free) 290
    Number of Reflections(R-Work) 5653
    R-Factor(R-Work) 0.1363
    R-Factor(R-Free) 0.1697
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.223
    Shell Resolution(Low) 1.2453
    Number of Reflections(Observed) 6013
    Number of Reflections(R-Free) 295
    Number of Reflections(R-Work) 5718
    R-Factor(R-Work) 0.135
    R-Factor(R-Free) 0.1678
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2453
    Shell Resolution(Low) 1.2692
    Number of Reflections(Observed) 6045
    Number of Reflections(R-Free) 332
    Number of Reflections(R-Work) 5713
    R-Factor(R-Work) 0.1307
    R-Factor(R-Free) 0.1609
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2692
    Shell Resolution(Low) 1.2951
    Number of Reflections(Observed) 6077
    Number of Reflections(R-Free) 312
    Number of Reflections(R-Work) 5765
    R-Factor(R-Work) 0.1254
    R-Factor(R-Free) 0.1597
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2951
    Shell Resolution(Low) 1.3233
    Number of Reflections(Observed) 6098
    Number of Reflections(R-Free) 292
    Number of Reflections(R-Work) 5806
    R-Factor(R-Work) 0.1233
    R-Factor(R-Free) 0.1445
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3233
    Shell Resolution(Low) 1.354
    Number of Reflections(Observed) 6189
    Number of Reflections(R-Free) 317
    Number of Reflections(R-Work) 5872
    R-Factor(R-Work) 0.1262
    R-Factor(R-Free) 0.1463
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.354
    Shell Resolution(Low) 1.3879
    Number of Reflections(Observed) 6212
    Number of Reflections(R-Free) 336
    Number of Reflections(R-Work) 5876
    R-Factor(R-Work) 0.12
    R-Factor(R-Free) 0.1507
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3879
    Shell Resolution(Low) 1.4254
    Number of Reflections(Observed) 6236
    Number of Reflections(R-Free) 342
    Number of Reflections(R-Work) 5896
    R-Factor(R-Work) 0.1129
    R-Factor(R-Free) 0.1495
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4254
    Shell Resolution(Low) 1.4673
    Number of Reflections(Observed) 6345
    Number of Reflections(R-Free) 324
    Number of Reflections(R-Work) 6021
    R-Factor(R-Work) 0.1088
    R-Factor(R-Free) 0.1344
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4673
    Shell Resolution(Low) 1.5146
    Number of Reflections(Observed) 6350
    Number of Reflections(R-Free) 320
    Number of Reflections(R-Work) 6030
    R-Factor(R-Work) 0.1103
    R-Factor(R-Free) 0.143
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5146
    Shell Resolution(Low) 1.5688
    Number of Reflections(Observed) 6419
    Number of Reflections(R-Free) 328
    Number of Reflections(R-Work) 6091
    R-Factor(R-Work) 0.1028
    R-Factor(R-Free) 0.1348
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5688
    Shell Resolution(Low) 1.6315
    Number of Reflections(Observed) 6459
    Number of Reflections(R-Free) 301
    Number of Reflections(R-Work) 6158
    R-Factor(R-Work) 0.1055
    R-Factor(R-Free) 0.1269
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6315
    Shell Resolution(Low) 1.7057
    Number of Reflections(Observed) 6465
    Number of Reflections(R-Free) 296
    Number of Reflections(R-Work) 6169
    R-Factor(R-Work) 0.1059
    R-Factor(R-Free) 0.1319
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7057
    Shell Resolution(Low) 1.7956
    Number of Reflections(Observed) 6512
    Number of Reflections(R-Free) 322
    Number of Reflections(R-Work) 6190
    R-Factor(R-Work) 0.114
    R-Factor(R-Free) 0.1265
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7956
    Shell Resolution(Low) 1.9079
    Number of Reflections(Observed) 6486
    Number of Reflections(R-Free) 328
    Number of Reflections(R-Work) 6158
    R-Factor(R-Work) 0.1181
    R-Factor(R-Free) 0.1381
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9079
    Shell Resolution(Low) 2.055
    Number of Reflections(Observed) 6607
    Number of Reflections(R-Free) 352
    Number of Reflections(R-Work) 6255
    R-Factor(R-Work) 0.1174
    R-Factor(R-Free) 0.1458
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.055
    Shell Resolution(Low) 2.2615
    Number of Reflections(Observed) 6575
    Number of Reflections(R-Free) 312
    Number of Reflections(R-Work) 6263
    R-Factor(R-Work) 0.1212
    R-Factor(R-Free) 0.1403
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2615
    Shell Resolution(Low) 2.5878
    Number of Reflections(Observed) 6619
    Number of Reflections(R-Free) 304
    Number of Reflections(R-Work) 6315
    R-Factor(R-Work) 0.1332
    R-Factor(R-Free) 0.1555
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5878
    Shell Resolution(Low) 3.257
    Number of Reflections(Observed) 6687
    Number of Reflections(R-Free) 340
    Number of Reflections(R-Work) 6347
    R-Factor(R-Work) 0.1417
    R-Factor(R-Free) 0.1596
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.257
    Shell Resolution(Low) 17.5637
    Number of Reflections(Observed) 6389
    Number of Reflections(R-Free) 332
    Number of Reflections(R-Work) 6057
    R-Factor(R-Work) 0.1566
    R-Factor(R-Free) 0.1839
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.011
    f_chiral_restr 0.121
    f_dihedral_angle_d 13.824
    f_angle_d 1.808
    f_bond_d 0.017
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3609
    Nucleic Acid Atoms 0
    Heterogen Atoms 83
    Solvent Atoms 612
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCCOLLECT, HKL3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution HKL3000, Molrep
    Structure Refinement SHelx, PHENIX (phenix.refine: 1.8.1_1161)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1161)
    refinement SHelx
    model building Molrep
    model building HKL3000
    data collection HKL3000
    data collection SBCCOLLECT