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X-RAY DIFFRACTION
Materials and Methods page
4HKY
  •   Crystallization Hide
    Crystallization Experiments
    pH 5.5
    Temperature 289.0
    Details 0.2 M ammonium sulfate, 0.1 M Bis-Tris pH 5.5, 25 % PEG 3350, 5 mM CdCl2,10 mM faropenum, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 145.63 α = 90
    b = 39.32 β = 99.96
    c = 75.37 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2012-08-08
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97934
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2
    Resolution(Low) 50
    Number Reflections(All) 28649
    Number Reflections(Observed) 28649
    Percent Possible(Observed) 99.5
    B(Isotropic) From Wilson Plot 32.08
    Redundancy 3.5
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.03
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 2.3
    R-Sym I(Observed) 0.629
    Redundancy 3.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.004
    Resolution(Low) 37.117
    Cut-off Sigma(F) 1.33
    Number of Reflections(all) 28604
    Number of Reflections(Observed) 28604
    Number of Reflections(R-Free) 1446
    Percent Reflections(Observed) 99.49
    R-Factor(Observed) 0.2066
    R-Work 0.2041
    R-Free 0.2512
     
    Temperature Factor Modeling
    Isotropic Thermal Model mixed
    Mean Isotropic B Value 44.9
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0035
    Shell Resolution(Low) 2.0751
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.2832
    R-Factor(R-Free) 0.3626
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0751
    Shell Resolution(Low) 2.1582
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.2564
    R-Factor(R-Free) 0.3006
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1582
    Shell Resolution(Low) 2.2564
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.23
    R-Factor(R-Free) 0.3165
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2564
    Shell Resolution(Low) 2.3754
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.227
    R-Factor(R-Free) 0.2959
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3754
    Shell Resolution(Low) 2.5242
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.2225
    R-Factor(R-Free) 0.2523
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5242
    Shell Resolution(Low) 2.719
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2723
    R-Factor(R-Work) 0.2171
    R-Factor(R-Free) 0.2371
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.719
    Shell Resolution(Low) 2.9925
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.2077
    R-Factor(R-Free) 0.2454
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9925
    Shell Resolution(Low) 3.4253
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2725
    R-Factor(R-Work) 0.2061
    R-Factor(R-Free) 0.25
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4253
    Shell Resolution(Low) 4.3145
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2742
    R-Factor(R-Work) 0.1786
    R-Factor(R-Free) 0.2438
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3145
    Shell Resolution(Low) 37.1235
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2806
    R-Factor(R-Work) 0.1857
    R-Factor(R-Free) 0.2245
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.528
    f_dihedral_angle_d 16.111
    f_angle_d 1.739
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3487
    Nucleic Acid Atoms 0
    Heterogen Atoms 77
    Solvent Atoms 136
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCCOLLECT, HKL3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution HKL3000, Molrep
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1161)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1161)
    model building Molrep
    model building HKL3000
    data collection HKL3000
    data collection SBCCOLLECT