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X-RAY DIFFRACTION
Materials and Methods page
4HJ9
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 290.0
    Details 25% PEG 6000, 0.2M ammonium formate, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 290K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 45 α = 90
    b = 57.47 β = 90
    c = 66.15 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type RIGAKU RAXIS IV++
    Collection Date 2011-11-21
     
    Diffraction Radiation
    Monochromator osmic mirrors
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH2R
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.77
    Resolution(Low) 50
    Number Reflections(All) 17399
    Number Reflections(Observed) 17235
    Percent Possible(Observed) 99.1
    R Merge I(Observed) 0.047
    Redundancy 3.2
     
    High Resolution Shell Details
    Resolution(High) 1.77
    Resolution(Low) 1.83
    Percent Possible(All) 95.5
    R Merge I(Observed) 0.512
    Redundancy 2.9
    Number Unique Reflections(All) 1624
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.85
    Resolution(Low) 31.232
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 15128
    Number of Reflections(Observed) 14821
    Number of Reflections(R-Free) 1484
    Percent Reflections(Observed) 97.47
    R-Factor(All) 0.2045
    R-Factor(Observed) 0.2045
    R-Work 0.2006
    R-Free 0.2396
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 36.0771
    Anisotropic B[1][1] 8.4058
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.5709
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -5.8349
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.85
    Shell Resolution(Low) 1.9097
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1151
    R-Factor(R-Work) 0.2199
    R-Factor(R-Free) 0.3095
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9097
    Shell Resolution(Low) 1.978
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1152
    R-Factor(R-Work) 0.1977
    R-Factor(R-Free) 0.2699
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.978
    Shell Resolution(Low) 2.0572
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1179
    R-Factor(R-Work) 0.1886
    R-Factor(R-Free) 0.2693
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0572
    Shell Resolution(Low) 2.1508
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1197
    R-Factor(R-Work) 0.2
    R-Factor(R-Free) 0.2634
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1508
    Shell Resolution(Low) 2.2641
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1183
    R-Factor(R-Work) 0.2029
    R-Factor(R-Free) 0.2646
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2641
    Shell Resolution(Low) 2.4059
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1217
    R-Factor(R-Work) 0.2019
    R-Factor(R-Free) 0.2395
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4059
    Shell Resolution(Low) 2.5916
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1233
    R-Factor(R-Work) 0.1986
    R-Factor(R-Free) 0.2165
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5916
    Shell Resolution(Low) 2.8523
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1220
    R-Factor(R-Work) 0.2012
    R-Factor(R-Free) 0.2826
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8523
    Shell Resolution(Low) 3.2646
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1235
    R-Factor(R-Work) 0.2108
    R-Factor(R-Free) 0.2389
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2646
    Shell Resolution(Low) 4.1116
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1259
    R-Factor(R-Work) 0.1856
    R-Factor(R-Free) 0.2135
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1116
    Shell Resolution(Low) 31.2359
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1311
    R-Factor(R-Work) 0.2082
    R-Factor(R-Free) 0.2321
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 18.296
    f_plane_restr 0.004
    f_chiral_restr 0.081
    f_angle_d 1.125
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1174
    Nucleic Acid Atoms 204
    Heterogen Atoms 0
    Solvent Atoms 123
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.7_650)
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction HKL