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X-RAY DIFFRACTION
Materials and Methods page
4HJ7
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 290.0
    Details 30% PEG 6000, 0.2M lithium nitrate, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 290K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 40.76 α = 90
    b = 58.18 β = 90
    c = 65.63 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type RIGAKU RAXIS IV++
    Collection Date 2012-03-08
     
    Diffraction Radiation
    Monochromator osmic mirrors
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH2R
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.78
    Resolution(Low) 50
    Number Reflections(All) 15437
    Number Reflections(Observed) 15354
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.036
    Redundancy 3.5
     
    High Resolution Shell Details
    Resolution(High) 1.79
    Resolution(Low) 1.85
    Percent Possible(All) 99.5
    R Merge I(Observed) 0.192
    Redundancy 3.4
    Number Unique Reflections(All) 1492
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.783
    Resolution(Low) 17.512
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 15326
    Number of Reflections(Observed) 15243
    Number of Reflections(R-Free) 1527
    Percent Reflections(Observed) 98.75
    R-Factor(All) 0.1769
    R-Factor(Observed) 0.1769
    R-Work 0.1737
    R-Free 0.2069
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 23.3169
    Anisotropic B[1][1] -0.7795
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 2.029
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.2495
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7828
    Shell Resolution(Low) 1.8402
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1130
    R-Factor(R-Work) 0.2314
    R-Factor(R-Free) 0.2705
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8402
    Shell Resolution(Low) 1.9059
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1218
    R-Factor(R-Work) 0.1934
    R-Factor(R-Free) 0.2346
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9059
    Shell Resolution(Low) 1.9821
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1224
    R-Factor(R-Work) 0.1758
    R-Factor(R-Free) 0.2662
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9821
    Shell Resolution(Low) 2.0722
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1237
    R-Factor(R-Work) 0.1698
    R-Factor(R-Free) 0.2406
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0722
    Shell Resolution(Low) 2.1813
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1249
    R-Factor(R-Work) 0.1669
    R-Factor(R-Free) 0.1938
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1813
    Shell Resolution(Low) 2.3177
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1242
    R-Factor(R-Work) 0.1716
    R-Factor(R-Free) 0.2011
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3177
    Shell Resolution(Low) 2.4961
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1251
    R-Factor(R-Work) 0.1768
    R-Factor(R-Free) 0.2239
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4961
    Shell Resolution(Low) 2.7465
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1274
    R-Factor(R-Work) 0.1824
    R-Factor(R-Free) 0.2106
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7465
    Shell Resolution(Low) 3.1419
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1263
    R-Factor(R-Work) 0.1704
    R-Factor(R-Free) 0.1964
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1419
    Shell Resolution(Low) 3.951
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1281
    R-Factor(R-Work) 0.1564
    R-Factor(R-Free) 0.2035
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.951
    Shell Resolution(Low) 17.5129
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1347
    R-Factor(R-Work) 0.1788
    R-Factor(R-Free) 0.182
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 16.98
    f_plane_restr 0.005
    f_chiral_restr 0.077
    f_angle_d 1.144
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1169
    Nucleic Acid Atoms 188
    Heterogen Atoms 0
    Solvent Atoms 184
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.7_650)
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction HKL