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X-RAY DIFFRACTION
Materials and Methods page
4HJ3
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 290.0
    Details 0.1 M HEPES, 4.3 M NaCl, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 290K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 105.78 α = 90
    b = 105.78 β = 90
    c = 83.98 γ = 120
     
    Space Group
    Space Group Name:    P 65
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Collection Date 2012-03-26
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE A1
    Wavelength List 0.978
    Site CHESS
    Beamline A1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.64
    Resolution(Low) 50
    Number Reflections(Observed) 15765
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.075
    Redundancy 10.7
     
    High Resolution Shell Details
    Resolution(High) 2.64
    Resolution(Low) 2.69
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.511
    Redundancy 9.6
    Number Unique Reflections(All) 772
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.643
    Resolution(Low) 45.806
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 15712
    Number of Reflections(R-Free) 1568
    Percent Reflections(Observed) 99.82
    R-Factor(Observed) 0.1958
    R-Work 0.1909
    R-Free 0.2403
     
    Temperature Factor Modeling
    Mean Isotropic B Value 41.2552
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6429
    Shell Resolution(Low) 2.7282
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1272
    R-Factor(R-Work) 0.2583
    R-Factor(R-Free) 0.3169
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7282
    Shell Resolution(Low) 2.8257
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1267
    R-Factor(R-Work) 0.2628
    R-Factor(R-Free) 0.3301
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8257
    Shell Resolution(Low) 2.9388
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1306
    R-Factor(R-Work) 0.2481
    R-Factor(R-Free) 0.3009
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9388
    Shell Resolution(Low) 3.0725
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1260
    R-Factor(R-Work) 0.2438
    R-Factor(R-Free) 0.2978
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0725
    Shell Resolution(Low) 3.2345
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1278
    R-Factor(R-Work) 0.2307
    R-Factor(R-Free) 0.2724
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2345
    Shell Resolution(Low) 3.437
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1272
    R-Factor(R-Work) 0.2155
    R-Factor(R-Free) 0.306
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.437
    Shell Resolution(Low) 3.7023
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1285
    R-Factor(R-Work) 0.1817
    R-Factor(R-Free) 0.237
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7023
    Shell Resolution(Low) 4.0747
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1303
    R-Factor(R-Work) 0.1741
    R-Factor(R-Free) 0.2188
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0747
    Shell Resolution(Low) 4.6638
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1279
    R-Factor(R-Work) 0.155
    R-Factor(R-Free) 0.2028
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6638
    Shell Resolution(Low) 5.874
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1305
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.2084
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.874
    Shell Resolution(Low) 45.8127
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1317
    R-Factor(R-Work) 0.1663
    R-Factor(R-Free) 0.209
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 19.57
    f_plane_restr 0.005
    f_chiral_restr 0.078
    f_angle_d 1.253
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2741
    Nucleic Acid Atoms 0
    Heterogen Atoms 62
    Solvent Atoms 41
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction HKL