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X-RAY DIFFRACTION
Materials and Methods page
4HIK
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 290.0
    Details 25% w/V PEG 4000, 0.2M ammonium formate, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 290K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 44.87 α = 90
    b = 57.39 β = 90
    c = 66.17 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-10-05
     
    Diffraction Radiation
    Monochromator Double crystal, Si(111)
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.2.1
    Wavelength List 0.9799, 0.9801, 0.9428
    Site ALS
    Beamline 8.2.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.64
    Resolution(Low) 50
    Percent Possible(Observed) 99.1
    R Merge I(Observed) 0.041
    Redundancy 4.5
     
    High Resolution Shell Details
    Resolution(High) 1.64
    Resolution(Low) 1.67
    Percent Possible(All) 93.8
    R Merge I(Observed) 0.134
    Redundancy 3.6
    Number Unique Reflections(All) 1916
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 1.636
    Resolution(Low) 35.348
    Cut-off Sigma(F) 0.05
    Number of Reflections(all) 21007
    Number of Reflections(Observed) 21007
    Number of Reflections(R-Free) 1051
    Percent Reflections(Observed) 96.62
    R-Factor(All) 0.1947
    R-Factor(Observed) 0.1947
    R-Work 0.1935
    R-Free 0.2157
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 18.4056
    Anisotropic B[1][1] 4.0568
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.0854
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.9514
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6357
    Shell Resolution(Low) 1.7101
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 2121
    R-Factor(R-Work) 0.2376
    R-Factor(R-Free) 0.289
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7101
    Shell Resolution(Low) 1.8003
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2439
    R-Factor(R-Work) 0.207
    R-Factor(R-Free) 0.2574
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8003
    Shell Resolution(Low) 1.9131
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2482
    R-Factor(R-Work) 0.1852
    R-Factor(R-Free) 0.2213
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9131
    Shell Resolution(Low) 2.0608
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2503
    R-Factor(R-Work) 0.1752
    R-Factor(R-Free) 0.184
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0608
    Shell Resolution(Low) 2.2681
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2533
    R-Factor(R-Work) 0.1875
    R-Factor(R-Free) 0.2147
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2681
    Shell Resolution(Low) 2.5963
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2585
    R-Factor(R-Work) 0.1986
    R-Factor(R-Free) 0.2238
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5963
    Shell Resolution(Low) 3.2706
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.2071
    R-Factor(R-Free) 0.2261
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2706
    Shell Resolution(Low) 35.3567
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2702
    R-Factor(R-Work) 0.1847
    R-Factor(R-Free) 0.1979
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 15.952
    f_plane_restr 0.004
    f_chiral_restr 0.075
    f_angle_d 1.058
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1169
    Nucleic Acid Atoms 185
    Heterogen Atoms 0
    Solvent Atoms 175
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution BnP
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    phasing BnP
    data reduction HKL