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X-RAY DIFFRACTION
Materials and Methods page
4HID
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 290.0
    Details 30% w/V PEG 3350, 0.2M sodium formate, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 290K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 40.96 α = 90
    b = 59.2 β = 90
    c = 66.09 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type RIGAKU RAXIS IV++
    Collection Date 2011-12-28
     
    Diffraction Radiation
    Monochromator osmic mirrors
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH2R
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.82
    Resolution(Low) 50
    Number Reflections(All) 14900
    Number Reflections(Observed) 14145
    Percent Possible(Observed) 95.0
    R Merge I(Observed) 0.072
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 1.83
    Resolution(Low) 1.9
    Percent Possible(All) 83.8
    R Merge I(Observed) 0.321
    Redundancy 2.5
    Number Unique Reflections(All) 1233
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.822
    Resolution(Low) 30.01
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 14900
    Number of Reflections(Observed) 13797
    Number of Reflections(R-Free) 1373
    Percent Reflections(Observed) 92.31
    R-Factor(All) 0.207
    R-Factor(Observed) 0.207
    R-Work 0.2054
    R-Free 0.2182
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 26.2916
    Anisotropic B[1][1] -2.0054
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 3.9925
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.9871
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8216
    Shell Resolution(Low) 1.8867
    Number of Reflections(R-Free) 105
    Number of Reflections(R-Work) 951
    R-Factor(R-Work) 0.2913
    R-Factor(R-Free) 0.3908
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8867
    Shell Resolution(Low) 1.9622
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 1165
    R-Factor(R-Work) 0.237
    R-Factor(R-Free) 0.2697
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9622
    Shell Resolution(Low) 2.0515
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1220
    R-Factor(R-Work) 0.2112
    R-Factor(R-Free) 0.2255
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0515
    Shell Resolution(Low) 2.1597
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1221
    R-Factor(R-Work) 0.2158
    R-Factor(R-Free) 0.2491
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1597
    Shell Resolution(Low) 2.2949
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1250
    R-Factor(R-Work) 0.2128
    R-Factor(R-Free) 0.2345
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2949
    Shell Resolution(Low) 2.472
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1247
    R-Factor(R-Work) 0.2077
    R-Factor(R-Free) 0.2386
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.472
    Shell Resolution(Low) 2.7207
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1296
    R-Factor(R-Work) 0.2129
    R-Factor(R-Free) 0.2473
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7207
    Shell Resolution(Low) 3.114
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1306
    R-Factor(R-Work) 0.2128
    R-Factor(R-Free) 0.2464
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.114
    Shell Resolution(Low) 3.9219
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1334
    R-Factor(R-Work) 0.1845
    R-Factor(R-Free) 0.1691
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9219
    Shell Resolution(Low) 30.014
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1434
    R-Factor(R-Work) 0.195
    R-Factor(R-Free) 0.1978
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 19.844
    f_plane_restr 0.003
    f_chiral_restr 0.052
    f_angle_d 0.797
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1169
    Nucleic Acid Atoms 182
    Heterogen Atoms 0
    Solvent Atoms 196
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.7_650)
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction HKL
    data collection DENZO