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X-RAY DIFFRACTION
Materials and Methods page
4HHZ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 293.0
    Details 0.1M TRIS pH 8.0, 1% PEG400, 1.9M (NH4)2SO4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 103.02 α = 90
    b = 107.26 β = 90
    c = 142.21 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC Quantum Q315r
    Collection Date 2012-04-17
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.979
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.22
    Resolution(Low) 48.43
    Number Reflections(Observed) 77829
    Percent Possible(Observed) 99.1
    R Merge I(Observed) 0.18
    B(Isotropic) From Wilson Plot 50.167
     
    High Resolution Shell Details
    Resolution(High) 2.22
    Resolution(Low) 2.35
    Percent Possible(All) 94.8
    R Merge I(Observed) 0.016
    Mean I Over Sigma(Observed) 1.05
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.7199
    Resolution(Low) 48.431
    Cut-off Sigma(F) 2.01
    Number of Reflections(Observed) 43017
    Number of Reflections(R-Free) 1291
    Percent Reflections(Observed) 99.96
    R-Factor(Observed) 0.2068
    R-Work 0.2047
    R-Free 0.2748
     
    Temperature Factor Modeling
    Mean Isotropic B Value 24.843
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7199
    Shell Resolution(Low) 2.8288
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4585
    R-Factor(R-Work) 0.2543
    R-Factor(R-Free) 0.3387
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8288
    Shell Resolution(Low) 2.9576
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4551
    R-Factor(R-Work) 0.2558
    R-Factor(R-Free) 0.37
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9576
    Shell Resolution(Low) 3.1135
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4591
    R-Factor(R-Work) 0.2417
    R-Factor(R-Free) 0.3539
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1135
    Shell Resolution(Low) 3.3085
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4591
    R-Factor(R-Work) 0.2142
    R-Factor(R-Free) 0.2921
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3085
    Shell Resolution(Low) 3.5639
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4594
    R-Factor(R-Work) 0.2013
    R-Factor(R-Free) 0.2904
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5639
    Shell Resolution(Low) 3.9224
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4603
    R-Factor(R-Work) 0.1882
    R-Factor(R-Free) 0.2621
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9224
    Shell Resolution(Low) 4.4896
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 4653
    R-Factor(R-Work) 0.1787
    R-Factor(R-Free) 0.2643
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4896
    Shell Resolution(Low) 5.655
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 4693
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.226
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.655
    Shell Resolution(Low) 48.4385
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 4865
    R-Factor(R-Work) 0.2129
    R-Factor(R-Free) 0.2445
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.093
    f_dihedral_angle_d 18.66
    f_angle_d 1.376
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10574
    Nucleic Acid Atoms 0
    Heterogen Atoms 155
    Solvent Atoms 24
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Bluice
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser version: 2.3.0
    data reduction Xscale