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X-RAY DIFFRACTION
Materials and Methods page
4HHY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 293.0
    Details 0.1M TRIS pH 8.0, 1% PEG400, 1.9M (NH4)2SO4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 103.8 α = 90
    b = 107.55 β = 90
    c = 143.11 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC Quantum Q315r
    Collection Date 2012-03-22
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.979
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.28
    Resolution(Low) 43.61
    Number Reflections(Observed) 137838
    Percent Possible(Observed) 97.5
    R Merge I(Observed) 0.069
    B(Isotropic) From Wilson Plot 52.413
     
    High Resolution Shell Details
    Resolution(High) 2.28
    Resolution(Low) 2.42
    Percent Possible(All) 97.3
    R Merge I(Observed) 0.7
    Mean I Over Sigma(Observed) 2.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3637
    Resolution(Low) 43.606
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 64828
    Number of Reflections(R-Free) 3288
    Percent Reflections(Observed) 97.92
    R-Factor(Observed) 0.2404
    R-Work 0.2373
    R-Free 0.2992
     
    Temperature Factor Modeling
    Mean Isotropic B Value 22.4082
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3637
    Shell Resolution(Low) 2.399
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.3205
    R-Factor(R-Free) 0.4108
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.399
    Shell Resolution(Low) 2.4365
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.2947
    R-Factor(R-Free) 0.3586
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4365
    Shell Resolution(Low) 2.4764
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.2876
    R-Factor(R-Free) 0.3337
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4764
    Shell Resolution(Low) 2.5191
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.2797
    R-Factor(R-Free) 0.3366
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5191
    Shell Resolution(Low) 2.5649
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.2578
    R-Factor(R-Free) 0.3085
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5649
    Shell Resolution(Low) 2.6143
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.2811
    R-Factor(R-Free) 0.3823
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6143
    Shell Resolution(Low) 2.6676
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2610
    R-Factor(R-Work) 0.2996
    R-Factor(R-Free) 0.3408
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6676
    Shell Resolution(Low) 2.7256
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2151
    R-Factor(R-Work) 0.306
    R-Factor(R-Free) 0.4048
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7256
    Shell Resolution(Low) 2.789
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.3043
    R-Factor(R-Free) 0.3803
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.789
    Shell Resolution(Low) 2.8587
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.2814
    R-Factor(R-Free) 0.3604
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8587
    Shell Resolution(Low) 2.936
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.2806
    R-Factor(R-Free) 0.3681
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.936
    Shell Resolution(Low) 3.0224
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.2864
    R-Factor(R-Free) 0.3393
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0224
    Shell Resolution(Low) 3.1199
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2739
    R-Factor(R-Work) 0.2674
    R-Factor(R-Free) 0.3617
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1199
    Shell Resolution(Low) 3.2314
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.2638
    R-Factor(R-Free) 0.3004
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2314
    Shell Resolution(Low) 3.3607
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2726
    R-Factor(R-Work) 0.2564
    R-Factor(R-Free) 0.3252
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3607
    Shell Resolution(Low) 3.5136
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2521
    R-Factor(R-Work) 0.2433
    R-Factor(R-Free) 0.294
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5136
    Shell Resolution(Low) 3.6988
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2701
    R-Factor(R-Work) 0.2612
    R-Factor(R-Free) 0.3523
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6988
    Shell Resolution(Low) 3.9304
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2415
    R-Factor(R-Work) 0.2325
    R-Factor(R-Free) 0.2777
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9304
    Shell Resolution(Low) 4.2336
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2733
    R-Factor(R-Work) 0.2033
    R-Factor(R-Free) 0.2488
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2336
    Shell Resolution(Low) 4.6592
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2786
    R-Factor(R-Work) 0.1801
    R-Factor(R-Free) 0.2418
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6592
    Shell Resolution(Low) 5.3324
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2788
    R-Factor(R-Work) 0.182
    R-Factor(R-Free) 0.2407
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3324
    Shell Resolution(Low) 6.7143
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2813
    R-Factor(R-Work) 0.2352
    R-Factor(R-Free) 0.2757
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.7143
    Shell Resolution(Low) 43.613
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2858
    R-Factor(R-Work) 0.1972
    R-Factor(R-Free) 0.2364
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.091
    f_dihedral_angle_d 20.754
    f_angle_d 1.395
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10448
    Nucleic Acid Atoms 0
    Heterogen Atoms 189
    Solvent Atoms 84
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Bluice
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser version: 2.3.0
    data reduction Xscale