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X-RAY DIFFRACTION
Materials and Methods page
4HHT
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 6
    Temperature 291.0
    Details 50 mM CaCl2, 0.1 M MES pH 6.0, 45% PEG200, VAPOR DIFFUSION, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 106.95 α = 90
    b = 47.63 β = 131.26
    c = 77.45 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-10-09
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 3.1
    Resolution(Low) 29.11
    Number Reflections(All) 5501
    Number Reflections(Observed) 5292
    Percent Possible(Observed) 96.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.1
    Resolution(Low) 26.015
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 5501
    Number of Reflections(Observed) 5022
    Number of Reflections(R-Free) 238
    Percent Reflections(Observed) 91.98
    R-Factor(Observed) 0.1818
    R-Work 0.1781
    R-Free 0.2542
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.5934
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.6334
    Anisotropic B[2][2] 6.3581
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -5.7647
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1
    Shell Resolution(Low) 3.9036
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2242
    R-Factor(R-Work) 0.1907
    R-Factor(R-Free) 0.2944
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9036
    Shell Resolution(Low) 26.0158
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2542
    R-Factor(R-Work) 0.1708
    R-Factor(R-Free) 0.2287
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.066
    f_dihedral_angle_d 20.822
    f_angle_d 1.255
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1676
    Nucleic Acid Atoms 487
    Heterogen Atoms 2
    Solvent Atoms 24
     
     
  •   Software and Computing Hide
    Computing
    Data Collection px-cube
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building Phaser
    data collection px-cube