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X-RAY DIFFRACTION
Materials and Methods page
4HFU
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, sitting drop
    pH 8
    Temperature 293.2
    Details 10% PEG6000, 0.1 M Na citrate, pH 4 and 1 M LiCl, vapor diffusion, sitting drop, temperature 293.2K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 129.59 α = 90
    b = 129.59 β = 90
    c = 536.89 γ = 120
     
    Space Group
    Space Group Name:    H 3 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-06-16
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength List 1.0332
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3.1
    Resolution(Low) 45
    Number Reflections(Observed) 30241
    Percent Possible(Observed) 94.6
    R Merge I(Observed) 0.118
    Redundancy 9.2
     
    High Resolution Shell Details
    Resolution(High) 3.1
    Resolution(Low) 3.21
    Percent Possible(All) 63.0
    R Merge I(Observed) 0.315
    Redundancy 5.9
    Number Unique Reflections(All) 1985
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.106
    Resolution(Low) 41.898
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 27299
    Number of Reflections(R-Free) 1373
    Percent Reflections(Observed) 85.41
    R-Factor(Observed) 0.1953
    R-Work 0.1925
    R-Free 0.2505
     
    Temperature Factor Modeling
    Mean Isotropic B Value 63.0562
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1058
    Shell Resolution(Low) 3.2168
    Number of Reflections(R-Free) 24
    Number of Reflections(R-Work) 361
    R-Factor(R-Work) 0.2591
    R-Factor(R-Free) 0.247
    Percent Reflections(Observed) 12.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2168
    Shell Resolution(Low) 3.3456
    Number of Reflections(R-Free) 79
    Number of Reflections(R-Work) 1326
    R-Factor(R-Work) 0.2514
    R-Factor(R-Free) 0.3519
    Percent Reflections(Observed) 45.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3456
    Shell Resolution(Low) 3.4977
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2882
    R-Factor(R-Work) 0.2632
    R-Factor(R-Free) 0.3455
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4977
    Shell Resolution(Low) 3.6821
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 3001
    R-Factor(R-Work) 0.2282
    R-Factor(R-Free) 0.2833
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6821
    Shell Resolution(Low) 3.9126
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2994
    R-Factor(R-Work) 0.2056
    R-Factor(R-Free) 0.2594
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9126
    Shell Resolution(Low) 4.2144
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3036
    R-Factor(R-Work) 0.1797
    R-Factor(R-Free) 0.2393
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2144
    Shell Resolution(Low) 4.638
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3027
    R-Factor(R-Work) 0.1513
    R-Factor(R-Free) 0.2091
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.638
    Shell Resolution(Low) 5.308
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3032
    R-Factor(R-Work) 0.152
    R-Factor(R-Free) 0.2199
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.308
    Shell Resolution(Low) 6.6832
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 3076
    R-Factor(R-Work) 0.182
    R-Factor(R-Free) 0.2291
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.6832
    Shell Resolution(Low) 41.9022
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 3191
    R-Factor(R-Work) 0.1851
    R-Factor(R-Free) 0.2312
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 16.998
    f_plane_restr 0.004
    f_chiral_restr 0.053
    f_angle_d 0.753
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7211
    Nucleic Acid Atoms 0
    Heterogen Atoms 28
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection bluice
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1063)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser version: 2.3.0
    data reduction HKL
    data collection DENZO