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X-RAY DIFFRACTION
Materials and Methods page
4HFO
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.2
    Temperature 298.0
    Details pH 8.2, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 102.16 α = 90
    b = 70.66 β = 99.16
    c = 108.41 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2006-12-14
     
    Diffraction Radiation
    Monochromator Si-111
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97910
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3
    Resolution(Low) 50
    Number Reflections(All) 30762
    Number Reflections(Observed) 30762
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.1
    Redundancy 8.3
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.11
    Percent Possible(All) 99.5
    R Merge I(Observed) 0.382
    Redundancy 8.1
    Number Unique Reflections(All) 3050
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.0
    Resolution(Low) 42.662
    Cut-off Sigma(F) 1.91
    Number of Reflections(Observed) 30762
    Number of Reflections(R-Free) 2988
    Percent Reflections(Observed) 99.39
    R-Factor(Observed) 0.3225
    R-Work 0.3211
    R-Free 0.3487
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 83.6175
    Anisotropic B[1][1] -7.2698
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -11.9263
    Anisotropic B[2][2] -4.114
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.8191
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0
    Shell Resolution(Low) 3.0499
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 2608
    R-Factor(R-Work) 0.4075
    R-Factor(R-Free) 0.498
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0499
    Shell Resolution(Low) 3.1025
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.4076
    R-Factor(R-Free) 0.4366
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1025
    Shell Resolution(Low) 3.1589
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.3983
    R-Factor(R-Free) 0.392
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1589
    Shell Resolution(Low) 3.2196
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2725
    R-Factor(R-Work) 0.4053
    R-Factor(R-Free) 0.4523
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2196
    Shell Resolution(Low) 3.2853
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.3695
    R-Factor(R-Free) 0.4011
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2853
    Shell Resolution(Low) 3.3567
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2760
    R-Factor(R-Work) 0.3905
    R-Factor(R-Free) 0.4018
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3567
    Shell Resolution(Low) 3.4347
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2651
    R-Factor(R-Work) 0.3653
    R-Factor(R-Free) 0.3592
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4347
    Shell Resolution(Low) 3.5206
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2725
    R-Factor(R-Work) 0.3577
    R-Factor(R-Free) 0.4318
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5206
    Shell Resolution(Low) 3.6157
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.3185
    R-Factor(R-Free) 0.3383
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6157
    Shell Resolution(Low) 3.7221
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2773
    R-Factor(R-Work) 0.3354
    R-Factor(R-Free) 0.3663
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7221
    Shell Resolution(Low) 3.8421
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.3246
    R-Factor(R-Free) 0.3868
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8421
    Shell Resolution(Low) 3.9794
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2748
    R-Factor(R-Work) 0.3333
    R-Factor(R-Free) 0.2655
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9794
    Shell Resolution(Low) 4.1386
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.3216
    R-Factor(R-Free) 0.3094
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1386
    Shell Resolution(Low) 4.3268
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.3029
    R-Factor(R-Free) 0.2983
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3268
    Shell Resolution(Low) 4.5546
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.2804
    R-Factor(R-Free) 0.2679
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5546
    Shell Resolution(Low) 4.8396
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.2351
    R-Factor(R-Free) 0.298
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8396
    Shell Resolution(Low) 5.2127
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.2994
    R-Factor(R-Free) 0.3077
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2127
    Shell Resolution(Low) 5.7361
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.2956
    R-Factor(R-Free) 0.4199
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7361
    Shell Resolution(Low) 6.5636
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.3234
    R-Factor(R-Free) 0.3896
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5636
    Shell Resolution(Low) 8.2596
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.3296
    R-Factor(R-Free) 0.3811
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.2596
    Shell Resolution(Low) 42.6658
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.2548
    R-Factor(R-Free) 0.3099
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.432
    f_plane_restr 0.003
    f_chiral_restr 0.072
    f_angle_d 0.912
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 12360
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection In-house software
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Solution HKL3000
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction HKL