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X-RAY DIFFRACTION
Materials and Methods page
4HFK
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 293.0
    Details 0.2M Sodium chloride, 0.1M Na/K phosphate pH 6.5, 25% (w/v) PEG 1000, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 91.34 α = 90
    b = 138.14 β = 127.89
    c = 64.46 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2012-06-18
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BSRF BEAMLINE 3W1A
    Wavelength List 0.9793
    Site BSRF
    Beamline 3W1A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.1
    Resolution(Low) 50
    Number Reflections(All) 36726
    Number Reflections(Observed) 36726
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.062
    Redundancy 7.7
     
    High Resolution Shell Details
    Resolution(High) 2.1
    Resolution(Low) 2.14
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.232
    Mean I Over Sigma(Observed) 10.5
    Redundancy 7.5
    Number Unique Reflections(All) 1834
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.1
    Resolution(Low) 23.402
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 36681
    Number of Reflections(Observed) 36681
    Number of Reflections(R-Free) 1834
    Percent Reflections(Observed) 99.96
    R-Factor(All) 0.1591
    R-Factor(Observed) 0.1568
    R-Work 0.1568
    R-Free 0.2035
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.7697
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -1.0899
    Anisotropic B[2][2] -2.4582
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.6885
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1
    Shell Resolution(Low) 2.1568
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.1745
    R-Factor(R-Free) 0.2455
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1568
    Shell Resolution(Low) 2.2202
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.1502
    R-Factor(R-Free) 0.2132
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2202
    Shell Resolution(Low) 2.2918
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.1426
    R-Factor(R-Free) 0.2166
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2918
    Shell Resolution(Low) 2.3736
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.1442
    R-Factor(R-Free) 0.2031
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3736
    Shell Resolution(Low) 2.4685
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.1514
    R-Factor(R-Free) 0.2161
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4685
    Shell Resolution(Low) 2.5808
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.1517
    R-Factor(R-Free) 0.2214
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5808
    Shell Resolution(Low) 2.7166
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2666
    R-Factor(R-Work) 0.1591
    R-Factor(R-Free) 0.2229
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7166
    Shell Resolution(Low) 2.8866
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2683
    R-Factor(R-Work) 0.1588
    R-Factor(R-Free) 0.1901
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8866
    Shell Resolution(Low) 3.109
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.1612
    R-Factor(R-Free) 0.207
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.109
    Shell Resolution(Low) 3.421
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.1663
    R-Factor(R-Free) 0.2104
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.421
    Shell Resolution(Low) 3.914
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.1546
    R-Factor(R-Free) 0.1916
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.914
    Shell Resolution(Low) 4.9236
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.135
    R-Factor(R-Free) 0.1673
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9236
    Shell Resolution(Low) 23.4039
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.186
    R-Factor(R-Free) 0.2102
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.071
    f_dihedral_angle_d 12.595
    f_angle_d 1.057
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3934
    Nucleic Acid Atoms 0
    Heterogen Atoms 5
    Solvent Atoms 477
     
     
  •   Software and Computing Hide
    Computing
    Data Collection marccd
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection marccd