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X-RAY DIFFRACTION
Materials and Methods page
4HF5
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, sitting drop
    pH 8.5
    Temperature 295.7
    Details 11% PEG4000, 0.1 M Tris, pH 8.5 and 0.1 M MgCl2, vapor diffusion, sitting drop, temperature 295.7K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 136.62 α = 90
    b = 136.62 β = 90
    c = 142.13 γ = 120
     
    Space Group
    Space Group Name:    P 3 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-03-23
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength List 1.0332
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3
    Resolution(Low) 50
    Number Reflections(Observed) 29412
    Percent Possible(Observed) 94.7
    R Merge I(Observed) 0.097
    Redundancy 3.9
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.11
    Percent Possible(All) 64.8
    R Merge I(Observed) 0.589
    Redundancy 3.2
    Number Unique Reflections(All) 1988
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.004
    Resolution(Low) 44.718
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 27264
    Number of Reflections(R-Free) 1395
    Percent Reflections(Observed) 87.78
    R-Factor(Observed) 0.2318
    R-Work 0.229
    R-Free 0.2822
     
    Temperature Factor Modeling
    Mean Isotropic B Value 98.2333
    Anisotropic B[1][1] 6.5736
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.5736
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -13.1472
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0044
    Shell Resolution(Low) 3.1117
    Number of Reflections(R-Free) 62
    Number of Reflections(R-Work) 1476
    R-Factor(R-Work) 0.368
    R-Factor(R-Free) 0.3948
    Percent Reflections(Observed) 50.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1117
    Shell Resolution(Low) 3.2363
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2082
    R-Factor(R-Work) 0.3397
    R-Factor(R-Free) 0.3997
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2363
    Shell Resolution(Low) 3.3835
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2406
    R-Factor(R-Work) 0.2984
    R-Factor(R-Free) 0.3678
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3835
    Shell Resolution(Low) 3.5618
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.2795
    R-Factor(R-Free) 0.3449
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5618
    Shell Resolution(Low) 3.7849
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2736
    R-Factor(R-Work) 0.2498
    R-Factor(R-Free) 0.3221
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7849
    Shell Resolution(Low) 4.077
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2789
    R-Factor(R-Work) 0.2157
    R-Factor(R-Free) 0.2517
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.077
    Shell Resolution(Low) 4.4869
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2851
    R-Factor(R-Work) 0.1857
    R-Factor(R-Free) 0.2314
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4869
    Shell Resolution(Low) 5.1353
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 2902
    R-Factor(R-Work) 0.1847
    R-Factor(R-Free) 0.2585
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1353
    Shell Resolution(Low) 6.4669
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2963
    R-Factor(R-Work) 0.211
    R-Factor(R-Free) 0.288
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.4669
    Shell Resolution(Low) 44.7227
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 3098
    R-Factor(R-Work) 0.2297
    R-Factor(R-Free) 0.2656
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 22.077
    f_plane_restr 0.005
    f_chiral_restr 0.076
    f_angle_d 1.229
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6561
    Nucleic Acid Atoms 0
    Heterogen Atoms 78
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser
    data reduction HKL
     
     
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