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X-RAY DIFFRACTION
Materials and Methods page
4HEA
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6
    Temperature 295.0
    Details 100 mM Bis-Tris pH 6.0, 26% (w/v) polyethylene glycol (PEG) 4000, 100 mM KCl, 100 mM glutaric acid pH 6.0 and 0.6% DDM, VAPOR DIFFUSION, SITTING DROP, temperature 295K
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6
    Temperature 295.0
    Details 100 mM Bis-Tris pH 6.0, 24% (w/v) polyethylene glycol (PEG) 4000, 100 mM KCl, 100 mM glutaric acid pH 6.0 and 50 mM NDSB-201, VAPOR DIFFUSION, SITTING DROP, temperature 295K
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6
    Temperature 295.0
    Details 100 mM Bis-Tris pH 6.0, 19% (w/v) polyethylene glycol (PEG) 4000, 100 mM KCl, 100 mM glutaric acid pH 6.0 and 2.2 mM FOS-CHOLINE-8 fluorinated , VAPOR DIFFUSION, SITTING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 96.28 α = 90
    b = 340.89 β = 100.57
    c = 263.3 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
    Diffrn ID 2
    Data Collection Temperature 100
    Diffrn ID 3
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PSI PILATUS 6M
    Details mirrors
    Collection Date 2011-02-16
    Detector PIXEL
    Type PSI PILATUS 6M
    Details mirrors
    Collection Date 2011-12-03
    Detector PIXEL
    Type PSI PILATUS 6M
    Details mirrors
    Collection Date 2011-09-23
     
    Diffraction Radiation
    Monochromator Si(311)
    Diffraction Protocol SINGLE WAVELENGTH
    Monochromator Si(311)
    Diffraction Protocol SINGLE WAVELENGTH
    Monochromator Si(311)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID29
    Wavelength List 0.9
    Site ESRF
    Beamline ID29
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID29
    Wavelength List 0.9
    Site ESRF
    Beamline ID29
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID29
    Wavelength List 0.9
    Site ESRF
    Beamline ID29
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3.3
    Resolution(Low) 40
    Number Reflections(All) 247920
    Number Reflections(Observed) 247920
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.251
    B(Isotropic) From Wilson Plot 99.0
    Redundancy 6.1
     
    High Resolution Shell Details
    Resolution(High) 3.3
    Resolution(Low) 3.48
    Percent Possible(All) 99.0
    R Merge I(Observed) 1.869
    Mean I Over Sigma(Observed) 1.0
    R-Sym I(Observed) 1.869
    Redundancy 5.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.3027
    Resolution(Low) 39.998
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 233383
    Number of Reflections(Observed) 233383
    Number of Reflections(R-Free) 2427
    Percent Reflections(Observed) 93.66
    R-Factor(Observed) 0.2034
    R-Work 0.2024
    R-Free 0.2393
    R-Free Selection Details Random, using lattice symmetry information (PHENIX).
     
    Temperature Factor Modeling
    Isotropic Thermal Model TLS and isotropic
    Mean Isotropic B Value 74.4
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3027
    Shell Resolution(Low) 3.37
    Number of Reflections(R-Free) 67
    Number of Reflections(R-Work) 5388
    R-Factor(R-Work) 0.2842
    R-Factor(R-Free) 0.3081
    Percent Reflections(Observed) 37.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.37
    Shell Resolution(Low) 3.4432
    Number of Reflections(R-Free) 97
    Number of Reflections(R-Work) 10229
    R-Factor(R-Work) 0.2653
    R-Factor(R-Free) 0.3046
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4432
    Shell Resolution(Low) 3.5232
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 13541
    R-Factor(R-Work) 0.2485
    R-Factor(R-Free) 0.3042
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5232
    Shell Resolution(Low) 3.6112
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 14324
    R-Factor(R-Work) 0.2402
    R-Factor(R-Free) 0.2692
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6112
    Shell Resolution(Low) 3.7088
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 14430
    R-Factor(R-Work) 0.2338
    R-Factor(R-Free) 0.3029
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7088
    Shell Resolution(Low) 3.8178
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 14297
    R-Factor(R-Work) 0.223
    R-Factor(R-Free) 0.2564
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8178
    Shell Resolution(Low) 3.9408
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 14299
    R-Factor(R-Work) 0.2221
    R-Factor(R-Free) 0.257
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9408
    Shell Resolution(Low) 4.0814
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 14375
    R-Factor(R-Work) 0.2096
    R-Factor(R-Free) 0.2649
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0814
    Shell Resolution(Low) 4.2446
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 14397
    R-Factor(R-Work) 0.2056
    R-Factor(R-Free) 0.2223
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2446
    Shell Resolution(Low) 4.4373
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 14365
    R-Factor(R-Work) 0.1929
    R-Factor(R-Free) 0.222
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4373
    Shell Resolution(Low) 4.6707
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 14381
    R-Factor(R-Work) 0.188
    R-Factor(R-Free) 0.2461
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6707
    Shell Resolution(Low) 4.9625
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 14426
    R-Factor(R-Work) 0.1844
    R-Factor(R-Free) 0.2297
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9625
    Shell Resolution(Low) 5.3443
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 14429
    R-Factor(R-Work) 0.1898
    R-Factor(R-Free) 0.2227
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3443
    Shell Resolution(Low) 5.8796
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 14372
    R-Factor(R-Work) 0.1966
    R-Factor(R-Free) 0.2355
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8796
    Shell Resolution(Low) 6.7247
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 14496
    R-Factor(R-Work) 0.1941
    R-Factor(R-Free) 0.199
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.7247
    Shell Resolution(Low) 8.4507
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 14515
    R-Factor(R-Work) 0.1689
    R-Factor(R-Free) 0.2179
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.4507
    Shell Resolution(Low) 33.9226
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 14580
    R-Factor(R-Work) 0.1915
    R-Factor(R-Free) 0.2142
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.111
    f_dihedral_angle_d 18.03
    f_angle_d 1.467
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 73808
    Nucleic Acid Atoms 0
    Heterogen Atoms 190
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MOSFLM
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1041)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1041)
    model building PHASER
    data collection MOSFLM