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X-RAY DIFFRACTION
Materials and Methods page
4HE8
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.5
    Temperature 290.0
    Details 100 mM phosphate-citrate pH 4.5, 26% (v/v) PEG300, 5 mM CHAPS, VAPOR DIFFUSION, HANGING DROP, temperature 290K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 85.26 α = 91.91
    b = 120.54 β = 95.73
    c = 176.66 γ = 101.41
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Details mirrors
    Collection Date 2009-10-24
     
    Diffraction Radiation
    Monochromator Si(311)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID29
    Wavelength List 0.973
    Site ESRF
    Beamline ID29
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3.3
    Resolution(Low) 40
    Number Reflections(All) 99359
    Number Reflections(Observed) 99359
    Percent Possible(Observed) 96.4
    R Merge I(Observed) 0.077
    B(Isotropic) From Wilson Plot 97.0
    Redundancy 2.0
     
    High Resolution Shell Details
    Resolution(High) 3.3
    Resolution(Low) 3.48
    Percent Possible(All) 92.6
    R Merge I(Observed) 0.737
    Mean I Over Sigma(Observed) 0.9
    R-Sym I(Observed) 0.737
    Redundancy 1.9
    Number Unique Reflections(All) 13892
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.3
    Resolution(Low) 25.725
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 89170
    Number of Reflections(Observed) 89170
    Number of Reflections(R-Free) 1816
    Percent Reflections(Observed) 86.73
    R-Factor(All) 0.2099
    R-Factor(Observed) 0.2099
    R-Work 0.2088
    R-Free 0.2634
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model TLS and isotropic
    Mean Isotropic B Value 84.3
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3
    Shell Resolution(Low) 3.389
    Number of Reflections(R-Free) 53
    Number of Reflections(R-Work) 2172
    R-Factor(R-Work) 0.3233
    R-Factor(R-Free) 0.3704
    Percent Reflections(Observed) 28.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.389
    Shell Resolution(Low) 3.4885
    Number of Reflections(R-Free) 94
    Number of Reflections(R-Work) 4503
    R-Factor(R-Work) 0.3045
    R-Factor(R-Free) 0.3631
    Percent Reflections(Observed) 58.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4885
    Shell Resolution(Low) 3.6008
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 6480
    R-Factor(R-Work) 0.2862
    R-Factor(R-Free) 0.3431
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6008
    Shell Resolution(Low) 3.7292
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 7378
    R-Factor(R-Work) 0.2684
    R-Factor(R-Free) 0.3167
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7292
    Shell Resolution(Low) 3.878
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 7401
    R-Factor(R-Work) 0.2448
    R-Factor(R-Free) 0.3064
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.878
    Shell Resolution(Low) 4.0539
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 7492
    R-Factor(R-Work) 0.2175
    R-Factor(R-Free) 0.2934
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0539
    Shell Resolution(Low) 4.2667
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 7490
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.2596
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2667
    Shell Resolution(Low) 4.5326
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 7514
    R-Factor(R-Work) 0.1796
    R-Factor(R-Free) 0.2223
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5326
    Shell Resolution(Low) 4.8804
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 7510
    R-Factor(R-Work) 0.1698
    R-Factor(R-Free) 0.2609
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8804
    Shell Resolution(Low) 5.3675
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 7563
    R-Factor(R-Work) 0.1832
    R-Factor(R-Free) 0.2586
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3675
    Shell Resolution(Low) 6.135
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 7393
    R-Factor(R-Work) 0.207
    R-Factor(R-Free) 0.2445
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.135
    Shell Resolution(Low) 7.695
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 7394
    R-Factor(R-Work) 0.2108
    R-Factor(R-Free) 0.2363
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.695
    Shell Resolution(Low) 25.726
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 7064
    R-Factor(R-Work) 0.1876
    R-Factor(R-Free) 0.2192
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.071
    f_dihedral_angle_d 15.392
    f_angle_d 1.06
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 32514
    Nucleic Acid Atoms 0
    Heterogen Atoms 136
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MOSFLM
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1041)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1041)
    model building PHASER
    data collection MOSFLM