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X-RAY DIFFRACTION
Materials and Methods page
4HDJ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 289.15
    Details 10% Tacsimate, 10% PEG , pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 289.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 82.98 α = 90
    b = 82.98 β = 90
    c = 83.38 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-06-11
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.2.2
    Wavelength List 1.0
    Site ALS
    Beamline 8.2.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.85
    Resolution(Low) 36
    Number Reflections(All) 28674
    Number Reflections(Observed) 28674
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.85
    Resolution(Low) 36.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 28674
    Number of Reflections(Observed) 28674
    Number of Reflections(R-Free) 1463
    Percent Reflections(Observed) 99.36
    R-Factor(All) 0.1627
    R-Factor(Observed) 0.1627
    R-Work 0.1604
    R-Free 0.2053
    R-Free Selection Details 5.1% random selection
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8478
    Shell Resolution(Low) 1.9139
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.1863
    R-Factor(R-Free) 0.2579
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9139
    Shell Resolution(Low) 1.9905
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.2478
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9905
    Shell Resolution(Low) 2.0811
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.1673
    R-Factor(R-Free) 0.2326
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0811
    Shell Resolution(Low) 2.1908
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.1631
    R-Factor(R-Free) 0.2362
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1908
    Shell Resolution(Low) 2.328
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2684
    R-Factor(R-Work) 0.1679
    R-Factor(R-Free) 0.221
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.328
    Shell Resolution(Low) 2.5077
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2717
    R-Factor(R-Work) 0.1615
    R-Factor(R-Free) 0.214
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5077
    Shell Resolution(Low) 2.76
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.1794
    R-Factor(R-Free) 0.2173
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.76
    Shell Resolution(Low) 3.1592
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.1725
    R-Factor(R-Free) 0.2125
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1592
    Shell Resolution(Low) 3.9794
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2775
    R-Factor(R-Work) 0.1472
    R-Factor(R-Free) 0.2005
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9794
    Shell Resolution(Low) 36.0684
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2820
    R-Factor(R-Work) 0.1413
    R-Factor(R-Free) 0.1498
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.099
    f_dihedral_angle_d 14.239
    f_angle_d 1.565
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2643
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 402
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)