X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 293.0
Details 10% PEG4K, 0.5M Li2SO4, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 64.48 α = 90
b = 99.99 β = 90
c = 69.67 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2003-03-31
Diffraction Radiation
Monochromator Protocol
Cryogenically-cooled double crystal Si(111) monochromator. SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 1.000 APS 24-ID-C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 22.56 72.8 -- -- -- -- 23698 23698 0.0 0.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.7 22.56 -- 1.35 22754 22754 2232 90.65 0.177 0.1753 0.1711 0.2144 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7 1.7371 -- 51 490 0.2357 0.2885 -- 36.0
X Ray Diffraction 1.7371 1.7775 -- 85 787 0.2568 0.3667 -- 57.0
X Ray Diffraction 1.7775 1.8219 -- 111 1134 0.2378 0.2384 -- 80.0
X Ray Diffraction 1.8219 1.8712 -- 164 1300 0.2237 0.2641 -- 93.0
X Ray Diffraction 1.8712 1.9262 -- 118 1353 0.1974 0.215 -- 96.0
X Ray Diffraction 1.9262 1.9883 -- 163 1393 0.1782 0.2048 -- 99.0
X Ray Diffraction 1.9883 2.0593 -- 148 1382 0.1771 0.2273 -- 99.0
X Ray Diffraction 2.0593 2.1417 -- 153 1382 0.1588 0.2018 -- 100.0
X Ray Diffraction 2.1417 2.2391 -- 172 1379 0.1567 0.1872 -- 99.0
X Ray Diffraction 2.2391 2.3571 -- 142 1428 0.1625 0.2029 -- 100.0
X Ray Diffraction 2.3571 2.5046 -- 162 1389 0.1727 0.2344 -- 99.0
X Ray Diffraction 2.5046 2.6976 -- 160 1416 0.1709 0.2253 -- 99.0
X Ray Diffraction 2.6976 2.9686 -- 151 1410 0.1594 0.2269 -- 99.0
X Ray Diffraction 2.9686 3.3969 -- 144 1413 0.1632 0.2207 -- 98.0
X Ray Diffraction 3.3969 4.2749 -- 143 1425 0.1544 0.1944 -- 98.0
X Ray Diffraction 4.2749 22.5615 -- 165 1441 0.1783 0.2037 -- 96.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.007
f_chiral_restr 0.072
f_dihedral_angle_d 14.35
f_angle_d 1.341
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1466
Nucleic Acid Atoms 0
Heterogen Atoms 14
Solvent Atoms 247

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
PHASER model building
HKL-2000 data collection