POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4HD9
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 293.0
    Details 10% PEG4K, 0.5M Li2SO4, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 64.48 α = 90
    b = 99.99 β = 90
    c = 69.67 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2003-03-31
     
    Diffraction Radiation
    Monochromator Cryogenically-cooled double crystal Si(111) monochromator.
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 1.000
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.7
    Resolution(Low) 22.56
    Number Reflections(All) 23698
    Number Reflections(Observed) 23698
    Percent Possible(Observed) 72.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.7
    Resolution(Low) 22.56
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 22754
    Number of Reflections(Observed) 22754
    Number of Reflections(R-Free) 2232
    Percent Reflections(Observed) 90.65
    R-Factor(All) 0.177
    R-Factor(Observed) 0.1753
    R-Work 0.1711
    R-Free 0.2144
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7
    Shell Resolution(Low) 1.7371
    Number of Reflections(R-Free) 51
    Number of Reflections(R-Work) 490
    R-Factor(R-Work) 0.2357
    R-Factor(R-Free) 0.2885
    Percent Reflections(Observed) 36.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7371
    Shell Resolution(Low) 1.7775
    Number of Reflections(R-Free) 85
    Number of Reflections(R-Work) 787
    R-Factor(R-Work) 0.2568
    R-Factor(R-Free) 0.3667
    Percent Reflections(Observed) 57.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7775
    Shell Resolution(Low) 1.8219
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 1134
    R-Factor(R-Work) 0.2378
    R-Factor(R-Free) 0.2384
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8219
    Shell Resolution(Low) 1.8712
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 1300
    R-Factor(R-Work) 0.2237
    R-Factor(R-Free) 0.2641
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8712
    Shell Resolution(Low) 1.9262
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 1353
    R-Factor(R-Work) 0.1974
    R-Factor(R-Free) 0.215
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9262
    Shell Resolution(Low) 1.9883
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 1393
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.2048
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9883
    Shell Resolution(Low) 2.0593
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1382
    R-Factor(R-Work) 0.1771
    R-Factor(R-Free) 0.2273
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0593
    Shell Resolution(Low) 2.1417
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1382
    R-Factor(R-Work) 0.1588
    R-Factor(R-Free) 0.2018
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1417
    Shell Resolution(Low) 2.2391
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 1379
    R-Factor(R-Work) 0.1567
    R-Factor(R-Free) 0.1872
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2391
    Shell Resolution(Low) 2.3571
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1428
    R-Factor(R-Work) 0.1625
    R-Factor(R-Free) 0.2029
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3571
    Shell Resolution(Low) 2.5046
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 1389
    R-Factor(R-Work) 0.1727
    R-Factor(R-Free) 0.2344
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5046
    Shell Resolution(Low) 2.6976
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1416
    R-Factor(R-Work) 0.1709
    R-Factor(R-Free) 0.2253
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6976
    Shell Resolution(Low) 2.9686
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1410
    R-Factor(R-Work) 0.1594
    R-Factor(R-Free) 0.2269
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9686
    Shell Resolution(Low) 3.3969
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1413
    R-Factor(R-Work) 0.1632
    R-Factor(R-Free) 0.2207
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3969
    Shell Resolution(Low) 4.2749
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1425
    R-Factor(R-Work) 0.1544
    R-Factor(R-Free) 0.1944
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2749
    Shell Resolution(Low) 22.5615
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 1441
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.2037
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.072
    f_dihedral_angle_d 14.35
    f_angle_d 1.341
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1466
    Nucleic Acid Atoms 0
    Heterogen Atoms 14
    Solvent Atoms 247
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection HKL-2000