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X-RAY DIFFRACTION
Materials and Methods page
4HC1
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 293.0
    Details 0.1 M Tris pH 7.0, 10% (w/v) PEG monomethyl ether (PEGMME) 2000, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 317.85 α = 90
    b = 71.73 β = 93.29
    c = 70.56 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2008-12-17
     
    Diffraction Radiation
    Monochromator Cryogenically-cooled double crystal Si(111) monochromator.
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 0.979
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.87
    Resolution(Low) 50
    Number Reflections(All) 35879
    Number Reflections(Observed) 35879
    Percent Possible(Observed) 100.0
     
    High Resolution Shell Details
    Resolution(High) 2.9
    Resolution(Low) 2.97
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.871
    Resolution(Low) 49.327
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 35861
    Number of Reflections(Observed) 35861
    Number of Reflections(R-Free) 1791
    Percent Reflections(Observed) 97.99
    R-Factor(All) 0.232
    R-Factor(Observed) 0.203
    R-Work 0.2004
    R-Free 0.2529
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8707
    Shell Resolution(Low) 2.9483
    Number of Reflections(R-Free) 98
    Number of Reflections(R-Work) 1999
    R-Factor(R-Work) 0.2919
    R-Factor(R-Free) 0.3581
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9483
    Shell Resolution(Low) 3.035
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.2682
    R-Factor(R-Free) 0.3643
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.035
    Shell Resolution(Low) 3.133
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.2557
    R-Factor(R-Free) 0.3502
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.133
    Shell Resolution(Low) 3.2449
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.2628
    R-Factor(R-Free) 0.2846
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2449
    Shell Resolution(Low) 3.3748
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2628
    R-Factor(R-Work) 0.2472
    R-Factor(R-Free) 0.3556
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3748
    Shell Resolution(Low) 3.5284
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.231
    R-Factor(R-Free) 0.2734
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5284
    Shell Resolution(Low) 3.7144
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.2204
    R-Factor(R-Free) 0.2883
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7144
    Shell Resolution(Low) 3.947
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.2085
    R-Factor(R-Free) 0.2418
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.947
    Shell Resolution(Low) 4.2516
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.1833
    R-Factor(R-Free) 0.2197
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2516
    Shell Resolution(Low) 4.6791
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.1516
    R-Factor(R-Free) 0.2031
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6791
    Shell Resolution(Low) 5.3555
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.1459
    R-Factor(R-Free) 0.2181
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3555
    Shell Resolution(Low) 6.7446
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.1884
    R-Factor(R-Free) 0.209
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.7446
    Shell Resolution(Low) 49.3346
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2762
    R-Factor(R-Work) 0.1797
    R-Factor(R-Free) 0.2229
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.046
    f_dihedral_angle_d 12.254
    f_angle_d 0.916
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9556
    Nucleic Acid Atoms 0
    Heterogen Atoms 28
    Solvent Atoms 31
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALA
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building Phaser
    data collection HKL-2000