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X-RAY DIFFRACTION
Materials and Methods page
4HBQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 293.0
    Details 0.1 M Tris pH 8.5, 0.2 M (NH4)2SO4, 12% polyethylene glycol (PEG) 8000, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 58.32 α = 90
    b = 69.7 β = 90
    c = 101.2 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2008-12-06
     
    Diffraction Radiation
    Monochromator double silicon crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-D
    Wavelength List 1.000
    Site APS
    Beamline 23-ID-D
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.4
    Resolution(Low) 44.73
    Number Reflections(All) 81325
    Number Reflections(Observed) 81325
    Percent Possible(Observed) 99.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.4
    Resolution(Low) 44.728
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 81248
    Number of Reflections(Observed) 81248
    Number of Reflections(R-Free) 1553
    Percent Reflections(Observed) 99.25
    R-Factor(Observed) 0.1441
    R-Work 0.1434
    R-Free 0.1785
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4
    Shell Resolution(Low) 1.4452
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 6872
    R-Factor(R-Work) 0.2359
    R-Factor(R-Free) 0.3144
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4452
    Shell Resolution(Low) 1.4968
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 7202
    R-Factor(R-Work) 0.1812
    R-Factor(R-Free) 0.2315
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4968
    Shell Resolution(Low) 1.5568
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 7177
    R-Factor(R-Work) 0.1409
    R-Factor(R-Free) 0.1994
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5568
    Shell Resolution(Low) 1.6276
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 7240
    R-Factor(R-Work) 0.1207
    R-Factor(R-Free) 0.1959
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6276
    Shell Resolution(Low) 1.7134
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 7287
    R-Factor(R-Work) 0.116
    R-Factor(R-Free) 0.1709
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7134
    Shell Resolution(Low) 1.8208
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 7277
    R-Factor(R-Work) 0.1115
    R-Factor(R-Free) 0.1468
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8208
    Shell Resolution(Low) 1.9614
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 7221
    R-Factor(R-Work) 0.1086
    R-Factor(R-Free) 0.1487
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9614
    Shell Resolution(Low) 2.1588
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 7306
    R-Factor(R-Work) 0.1143
    R-Factor(R-Free) 0.1494
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1588
    Shell Resolution(Low) 2.4711
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 7302
    R-Factor(R-Work) 0.1329
    R-Factor(R-Free) 0.1885
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4711
    Shell Resolution(Low) 3.1133
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 7359
    R-Factor(R-Work) 0.145
    R-Factor(R-Free) 0.168
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1133
    Shell Resolution(Low) 44.7507
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 7452
    R-Factor(R-Work) 0.166
    R-Factor(R-Free) 0.1847
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.076
    f_dihedral_angle_d 13.202
    f_angle_d 1.358
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3048
    Nucleic Acid Atoms 0
    Heterogen Atoms 30
    Solvent Atoms 508
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection HKL-2000