X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.5
Temperature 293.0
Details 0.1 M Tris pH 8.5, 0.2 M (NH4)2SO4, 12% polyethylene glycol (PEG) 8000, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 58.32 α = 90
b = 69.7 β = 90
c = 101.2 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2008-12-06
Diffraction Radiation
Monochromator Protocol
double silicon crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 1.000 APS 23-ID-D

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.4 44.73 99.2 -- -- -- -- 81325 81325 0.0 0.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.4 44.728 -- 1.99 81248 81248 1553 99.25 -- 0.1441 0.1434 0.1785 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4 1.4452 -- 134 6872 0.2359 0.3144 -- 95.0
X Ray Diffraction 1.4452 1.4968 -- 132 7202 0.1812 0.2315 -- 100.0
X Ray Diffraction 1.4968 1.5568 -- 143 7177 0.1409 0.1994 -- 100.0
X Ray Diffraction 1.5568 1.6276 -- 132 7240 0.1207 0.1959 -- 100.0
X Ray Diffraction 1.6276 1.7134 -- 110 7287 0.116 0.1709 -- 100.0
X Ray Diffraction 1.7134 1.8208 -- 125 7277 0.1115 0.1468 -- 100.0
X Ray Diffraction 1.8208 1.9614 -- 156 7221 0.1086 0.1487 -- 100.0
X Ray Diffraction 1.9614 2.1588 -- 170 7306 0.1143 0.1494 -- 100.0
X Ray Diffraction 2.1588 2.4711 -- 146 7302 0.1329 0.1885 -- 100.0
X Ray Diffraction 2.4711 3.1133 -- 156 7359 0.145 0.168 -- 100.0
X Ray Diffraction 3.1133 44.7507 -- 149 7452 0.166 0.1847 -- 97.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.008
f_dihedral_angle_d 13.202
f_chiral_restr 0.076
f_bond_d 0.009
f_angle_d 1.358
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3048
Nucleic Acid Atoms 0
Heterogen Atoms 30
Solvent Atoms 508

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
XDS Data Reduction (intensity integration)
SCALA Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
HKL-2000 data collection
PHASER model building