X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 291.0
Details 20% PEG 3350, 0.2 M ammonium iodide, VAPOR DIFFUSION, SITTING DROP, temperature 291K
Method Vapor Diffusion
Temperature 291.0
Details 20% PEG 3350, 0.2 M ammonium nitrate, VAPOR DIFFUSION, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 150.06 α = 90
b = 65.57 β = 90
c = 28.76 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV++ -- 2012-09-14
CCD RAYONIX MX-300 -- 2012-09-19
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 0.97949 CLSI 08ID-1
ROTATING ANODE RIGAKU FR-E SUPERBRIGHT 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.72 75.03 100.0 -- 0.072 -- 7.1 31276 31276 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.72 1.81 100.0 0.961 0.961 0.8 7.3 4483

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.72 37.54 -- 0.0 -- 31215 1583 99.98 -- 0.1781 0.1765 0.2072 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.72 1.765 -- 114 2145 0.29 0.299 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 29.6186
Anisotropic B[1][1] -1.15
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.71
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.56
RMS Deviations
Key Refinement Restraint Deviation
r_angle_refined_deg 1.524
r_dihedral_angle_1_deg 4.854
r_dihedral_angle_2_deg 34.199
r_dihedral_angle_3_deg 12.65
r_dihedral_angle_4_deg 17.291
r_gen_planes_other 0.001
r_chiral_restr 0.094
r_bond_other_d 0.001
r_angle_other_deg 0.824
r_gen_planes_refined 0.007
r_bond_refined_d 0.016
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1849
Nucleic Acid Atoms 0
Heterogen Atoms 9
Solvent Atoms 168

Software

Software
Software Name Purpose
SCALA data scaling version: 3.3.20
SHELX phasing
REFMAC refinement version: 5.7.0027
PDB_EXTRACT data extraction version: 3.11
XDS data reduction
shelx(siras) phasing
PHASER phasing