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X-RAY DIFFRACTION
Materials and Methods page
4HBD
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    Temperature 291.0
    Details 20% PEG 3350, 0.2 M ammonium iodide, VAPOR DIFFUSION, SITTING DROP, temperature 291K
    Method VAPOR DIFFUSION
    Temperature 291.0
    Details 20% PEG 3350, 0.2 M ammonium nitrate, VAPOR DIFFUSION, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 150.06 α = 90
    b = 65.57 β = 90
    c = 28.76 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
    Diffrn ID 2
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Collection Date 2012-09-14
    Detector CCD
    Type RAYONIX MX-300
    Collection Date 2012-09-19
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU FR-E SUPERBRIGHT
    Wavelength List 1.5418
    Source SYNCHROTRON
    Type CLSI BEAMLINE 08ID-1
    Wavelength List 0.97949
    Site CLSI
    Beamline 08ID-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.72
    Resolution(Low) 75.03
    Number Reflections(All) 31276
    Number Reflections(Observed) 31276
    Percent Possible(Observed) 100.0
    Redundancy 7.1
     
    High Resolution Shell Details
    Resolution(High) 1.72
    Resolution(Low) 1.81
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.961
    Mean I Over Sigma(Observed) 0.8
    R-Sym I(Observed) 0.961
    Redundancy 7.3
    Number Unique Reflections(All) 4483
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.72
    Resolution(Low) 37.54
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 31215
    Number of Reflections(R-Free) 1583
    Percent Reflections(Observed) 99.98
    R-Factor(Observed) 0.1781
    R-Work 0.1765
    R-Free 0.2072
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 29.6186
    Anisotropic B[1][1] -1.15
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.71
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.56
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.72
    Shell Resolution(Low) 1.765
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 2145
    R-Factor(R-Work) 0.29
    R-Factor(R-Free) 0.299
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.007
    r_chiral_restr 0.094
    r_dihedral_angle_4_deg 17.291
    r_dihedral_angle_3_deg 12.65
    r_dihedral_angle_2_deg 34.199
    r_dihedral_angle_1_deg 4.854
    r_angle_other_deg 0.824
    r_angle_refined_deg 1.524
    r_bond_other_d 0.001
    r_bond_refined_d 0.016
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1849
    Nucleic Acid Atoms 0
    Heterogen Atoms 9
    Solvent Atoms 168
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) xds
    Data Reduction (data scaling) SCALA
    Structure Solution shelx(siras), phaser
    Structure Refinement REFMAC 5.7.0027
     
    Software
    data extraction pdb_extract version: 3.11
    refinement REFMAC5 version: 5.7.0027
    phasing SHELX
    data reduction SCALA version: 3.3.20