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X-RAY DIFFRACTION
Materials and Methods page
4HB5
  •   Crystallization Hide
    Crystallization Experiments
    Method Microbatch crystallization under oil
    pH 8
    Temperature 277.0
    Details 20% PEG 4000, 0.1M magnesium sulfate, 0.1M Tris-HCl, pH 8.0, Microbatch crystallization under oil, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 56.98 α = 90
    b = 45.47 β = 107.17
    c = 63.15 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2012-09-21
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X4C
    Wavelength List 0.97885
    Site NSLS
    Beamline X4C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.3
    Resolution(Low) 50
    Number Reflections(All) 27096
    Number Reflections(Observed) 26798
    Percent Possible(Observed) 98.9
    R Merge I(Observed) 0.071
    B(Isotropic) From Wilson Plot 28.07
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.37
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.146
    Mean I Over Sigma(Observed) 8.8
    Redundancy 3.8
    Number Unique Reflections(All) 2694
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.294
    Resolution(Low) 35.537
    Cut-off Sigma(F) 1.15
    Number of Reflections(Observed) 26546
    Number of Reflections(R-Free) 1316
    Percent Reflections(Observed) 97.99
    R-Factor(Observed) 0.196
    R-Work 0.194
    R-Free 0.236
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 39.025
    Anisotropic B[1][1] -1.868
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 5.09
    Anisotropic B[2][2] -10.693
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 12.561
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.294
    Shell Resolution(Low) 2.386
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2814
    R-Factor(R-Work) 0.194
    R-Factor(R-Free) 0.257
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.386
    Shell Resolution(Low) 2.494
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 2857
    R-Factor(R-Work) 0.186
    R-Factor(R-Free) 0.255
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.494
    Shell Resolution(Low) 2.626
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2792
    R-Factor(R-Work) 0.203
    R-Factor(R-Free) 0.264
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.626
    Shell Resolution(Low) 2.79
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.234
    R-Factor(R-Free) 0.363
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.79
    Shell Resolution(Low) 3.006
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2899
    R-Factor(R-Work) 0.224
    R-Factor(R-Free) 0.274
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.006
    Shell Resolution(Low) 3.308
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2881
    R-Factor(R-Work) 0.216
    R-Factor(R-Free) 0.247
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.308
    Shell Resolution(Low) 3.786
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2731
    R-Factor(R-Work) 0.193
    R-Factor(R-Free) 0.227
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.786
    Shell Resolution(Low) 4.768
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2770
    R-Factor(R-Work) 0.16
    R-Factor(R-Free) 0.18
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.768
    Shell Resolution(Low) 35.541
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2779
    R-Factor(R-Work) 0.186
    R-Factor(R-Free) 0.206
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 17.113
    f_plane_restr 0.005
    f_chiral_restr 0.09
    f_angle_d 1.375
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2419
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 93
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution MolRep
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    data extraction pdb_extract version: 3.100
    refinement phenix