X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.2
Temperature 293.0
Details 0.1 M Na/K-phosphate, 2.5M NaCl, pH 6.2, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 96.4 α = 90
b = 99.17 β = 90
c = 100.61 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.075 NSLS X29A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 50 99.9 0.075 -- -- 7.0 30321 30321 2.0 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.6 44.092 4.8 1.33 30321 30302 1535 99.95 -- 0.198 0.1952 0.2503 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6 2.6839 -- 140 2581 0.2482 0.2858 -- 100.0
X Ray Diffraction 2.6839 2.7798 -- 147 2554 0.2426 0.3113 -- 100.0
X Ray Diffraction 2.7798 2.8911 -- 137 2574 0.2365 0.3616 -- 100.0
X Ray Diffraction 2.8911 3.0227 -- 129 2601 0.2254 0.296 -- 100.0
X Ray Diffraction 3.0227 3.182 -- 130 2590 0.2319 0.3132 -- 100.0
X Ray Diffraction 3.182 3.3813 -- 152 2579 0.2069 0.2621 -- 100.0
X Ray Diffraction 3.3813 3.6422 -- 126 2618 0.1885 0.246 -- 100.0
X Ray Diffraction 3.6422 4.0085 -- 130 2615 0.1684 0.2124 -- 100.0
X Ray Diffraction 4.0085 4.5881 -- 143 2639 0.1524 0.2077 -- 100.0
X Ray Diffraction 4.5881 5.7784 -- 148 2649 0.186 0.2358 -- 100.0
X Ray Diffraction 5.7784 44.092 -- 153 2767 0.2029 0.2385 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -0.5691
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -3.353
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 3.9222
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.071
f_dihedral_angle_d 16.785
f_angle_d 0.939
f_bond_d 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5879
Nucleic Acid Atoms 0
Heterogen Atoms 25
Solvent Atoms 172

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.7.2_869) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.2_869) refinement
PHASER model building
HKL-2000 data collection