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X-RAY DIFFRACTION
Materials and Methods page
4H9S
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.2
    Temperature 293.0
    Details 0.1 M Na/K-phosphate, 2.5M NaCl, pH 6.2, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 96.4 α = 90
    b = 99.17 β = 90
    c = 100.61 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Radiation
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.6
    Resolution(Low) 50
    Number Reflections(All) 30321
    Number Reflections(Observed) 30321
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.075
    Redundancy 7.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 44.092
    Cut-off Sigma(I) 4.8
    Cut-off Sigma(F) 1.33
    Number of Reflections(all) 30321
    Number of Reflections(Observed) 30302
    Number of Reflections(R-Free) 1535
    Percent Reflections(Observed) 99.95
    R-Factor(Observed) 0.198
    R-Work 0.1952
    R-Free 0.2503
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.5691
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.353
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.9222
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6
    Shell Resolution(Low) 2.6839
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2581
    R-Factor(R-Work) 0.2482
    R-Factor(R-Free) 0.2858
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6839
    Shell Resolution(Low) 2.7798
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.2426
    R-Factor(R-Free) 0.3113
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7798
    Shell Resolution(Low) 2.8911
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2574
    R-Factor(R-Work) 0.2365
    R-Factor(R-Free) 0.3616
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8911
    Shell Resolution(Low) 3.0227
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.2254
    R-Factor(R-Free) 0.296
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0227
    Shell Resolution(Low) 3.182
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2590
    R-Factor(R-Work) 0.2319
    R-Factor(R-Free) 0.3132
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.182
    Shell Resolution(Low) 3.3813
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2579
    R-Factor(R-Work) 0.2069
    R-Factor(R-Free) 0.2621
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3813
    Shell Resolution(Low) 3.6422
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.1885
    R-Factor(R-Free) 0.246
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6422
    Shell Resolution(Low) 4.0085
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.1684
    R-Factor(R-Free) 0.2124
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0085
    Shell Resolution(Low) 4.5881
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.1524
    R-Factor(R-Free) 0.2077
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5881
    Shell Resolution(Low) 5.7784
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.186
    R-Factor(R-Free) 0.2358
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7784
    Shell Resolution(Low) 44.092
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2767
    R-Factor(R-Work) 0.2029
    R-Factor(R-Free) 0.2385
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.071
    f_dihedral_angle_d 16.785
    f_angle_d 0.939
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5879
    Nucleic Acid Atoms 0
    Heterogen Atoms 25
    Solvent Atoms 172
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building PHASER
    data collection HKL-2000