X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.8
Temperature 277.0
Details 1.6 M Na/K-phosphate, pH 6.8, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 107.7 α = 90
b = 107.7 β = 90
c = 90.71 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.979 APS 24-ID-E

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50 100.0 0.071 -- -- 9.6 27814 27814 2.0 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.197 38.968 3.7 1.36 27814 27739 1394 99.91 -- 0.1863 0.1838 0.2302 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.197 2.2756 -- 115 2578 0.2331 0.2608 -- 99.0
X Ray Diffraction 2.2756 2.3667 -- 134 2580 0.2098 0.2842 -- 100.0
X Ray Diffraction 2.3667 2.4744 -- 125 2615 0.2039 0.2558 -- 100.0
X Ray Diffraction 2.4744 2.6049 -- 172 2570 0.1994 0.2369 -- 100.0
X Ray Diffraction 2.6049 2.768 -- 143 2610 0.2003 0.2491 -- 100.0
X Ray Diffraction 2.768 2.9817 -- 127 2614 0.2029 0.2817 -- 100.0
X Ray Diffraction 2.9817 3.2816 -- 154 2615 0.1937 0.2606 -- 100.0
X Ray Diffraction 3.2816 3.7561 -- 135 2647 0.1657 0.2164 -- 100.0
X Ray Diffraction 3.7561 4.731 -- 138 2691 0.1488 0.1829 -- 100.0
X Ray Diffraction 4.731 38.968 -- 151 2825 0.1916 0.2282 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.084
f_dihedral_angle_d 14.636
f_angle_d 1.11
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3092
Nucleic Acid Atoms 0
Heterogen Atoms 30
Solvent Atoms 228

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
PHASER model building
HKL-2000 data collection