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X-RAY DIFFRACTION
Materials and Methods page
4H9R
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.8
    Temperature 277.0
    Details 1.6 M Na/K-phosphate, pH 6.8, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 107.7 α = 90
    b = 107.7 β = 90
    c = 90.71 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Radiation
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Wavelength List 0.979
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.2
    Resolution(Low) 50
    Number Reflections(All) 27814
    Number Reflections(Observed) 27814
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.071
    Redundancy 9.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.197
    Resolution(Low) 38.968
    Cut-off Sigma(I) 3.7
    Cut-off Sigma(F) 1.36
    Number of Reflections(all) 27814
    Number of Reflections(Observed) 27739
    Number of Reflections(R-Free) 1394
    Percent Reflections(Observed) 99.91
    R-Factor(Observed) 0.1863
    R-Work 0.1838
    R-Free 0.2302
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.197
    Shell Resolution(Low) 2.2756
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2578
    R-Factor(R-Work) 0.2331
    R-Factor(R-Free) 0.2608
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2756
    Shell Resolution(Low) 2.3667
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.2098
    R-Factor(R-Free) 0.2842
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3667
    Shell Resolution(Low) 2.4744
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.2039
    R-Factor(R-Free) 0.2558
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4744
    Shell Resolution(Low) 2.6049
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 2570
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.2369
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6049
    Shell Resolution(Low) 2.768
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2610
    R-Factor(R-Work) 0.2003
    R-Factor(R-Free) 0.2491
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.768
    Shell Resolution(Low) 2.9817
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.2029
    R-Factor(R-Free) 0.2817
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9817
    Shell Resolution(Low) 3.2816
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.1937
    R-Factor(R-Free) 0.2606
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2816
    Shell Resolution(Low) 3.7561
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.1657
    R-Factor(R-Free) 0.2164
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7561
    Shell Resolution(Low) 4.731
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2691
    R-Factor(R-Work) 0.1488
    R-Factor(R-Free) 0.1829
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.731
    Shell Resolution(Low) 38.968
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2825
    R-Factor(R-Work) 0.1916
    R-Factor(R-Free) 0.2282
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.084
    f_dihedral_angle_d 14.636
    f_angle_d 1.11
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3092
    Nucleic Acid Atoms 0
    Heterogen Atoms 30
    Solvent Atoms 228
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection HKL-2000