X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 277.0
Details 1.8 M Na/K-phosphate, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 107.52 α = 90
b = 107.52 β = 90
c = 90.46 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.979 NSLS X29A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 50 99.7 -- -- -- -- 39075 39075 2.0 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.95 38.873 8.7 1.34 39075 38989 1947 99.65 0.2209 0.1924 0.1909 0.2209 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.95 2.0001 -- 132 2590 0.2566 0.3435 -- 100.0
X Ray Diffraction 2.0001 2.0542 -- 130 2623 0.2171 0.2506 -- 100.0
X Ray Diffraction 2.0542 2.1146 -- 162 2565 0.1935 0.2715 -- 100.0
X Ray Diffraction 2.1146 2.1829 -- 122 2649 0.1994 0.202 -- 100.0
X Ray Diffraction 2.1829 2.2609 -- 136 2601 0.1985 0.285 -- 100.0
X Ray Diffraction 2.2609 2.3514 -- 132 2627 0.2044 0.2061 -- 100.0
X Ray Diffraction 2.3514 2.4584 -- 135 2642 0.1916 0.2107 -- 100.0
X Ray Diffraction 2.4584 2.588 -- 145 2629 0.1994 0.2329 -- 100.0
X Ray Diffraction 2.588 2.7501 -- 140 2635 0.2055 0.2093 -- 100.0
X Ray Diffraction 2.7501 2.9623 -- 147 2639 0.2071 0.2592 -- 100.0
X Ray Diffraction 2.9623 3.2603 -- 133 2673 0.204 0.2718 -- 100.0
X Ray Diffraction 3.2603 3.7317 -- 154 2669 0.1805 0.1937 -- 100.0
X Ray Diffraction 3.7317 4.7003 -- 128 2730 0.1557 0.1904 -- 100.0
X Ray Diffraction 4.7003 38.873 -- 151 2770 0.1985 0.2072 -- 97.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -6.5676
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -6.5676
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 13.1351
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.067
f_dihedral_angle_d 14.863
f_angle_d 0.965
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3095
Nucleic Acid Atoms 0
Heterogen Atoms 45
Solvent Atoms 215

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.7.2_869) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.2_869) refinement
PHASER model building
HKL-2000 data collection