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X-RAY DIFFRACTION
Materials and Methods page
4H9Q
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 277.0
    Details 1.8 M Na/K-phosphate, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 107.52 α = 90
    b = 107.52 β = 90
    c = 90.46 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Radiation
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 0.979
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.95
    Resolution(Low) 50
    Number Reflections(All) 39075
    Number Reflections(Observed) 39075
    Percent Possible(Observed) 99.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.95
    Resolution(Low) 38.873
    Cut-off Sigma(I) 8.7
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 39075
    Number of Reflections(Observed) 38989
    Number of Reflections(R-Free) 1947
    Percent Reflections(Observed) 99.65
    R-Factor(All) 0.2209
    R-Factor(Observed) 0.1924
    R-Work 0.1909
    R-Free 0.2209
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -6.5676
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -6.5676
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 13.1351
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.95
    Shell Resolution(Low) 2.0001
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2590
    R-Factor(R-Work) 0.2566
    R-Factor(R-Free) 0.3435
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0001
    Shell Resolution(Low) 2.0542
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2623
    R-Factor(R-Work) 0.2171
    R-Factor(R-Free) 0.2506
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0542
    Shell Resolution(Low) 2.1146
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2565
    R-Factor(R-Work) 0.1935
    R-Factor(R-Free) 0.2715
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1146
    Shell Resolution(Low) 2.1829
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.202
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1829
    Shell Resolution(Low) 2.2609
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.1985
    R-Factor(R-Free) 0.285
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2609
    Shell Resolution(Low) 2.3514
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.2061
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3514
    Shell Resolution(Low) 2.4584
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.1916
    R-Factor(R-Free) 0.2107
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4584
    Shell Resolution(Low) 2.588
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.2329
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.588
    Shell Resolution(Low) 2.7501
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.2055
    R-Factor(R-Free) 0.2093
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7501
    Shell Resolution(Low) 2.9623
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.2071
    R-Factor(R-Free) 0.2592
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9623
    Shell Resolution(Low) 3.2603
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.204
    R-Factor(R-Free) 0.2718
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2603
    Shell Resolution(Low) 3.7317
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.1805
    R-Factor(R-Free) 0.1937
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7317
    Shell Resolution(Low) 4.7003
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.1557
    R-Factor(R-Free) 0.1904
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7003
    Shell Resolution(Low) 38.873
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2770
    R-Factor(R-Work) 0.1985
    R-Factor(R-Free) 0.2072
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.067
    f_dihedral_angle_d 14.863
    f_angle_d 0.965
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3095
    Nucleic Acid Atoms 0
    Heterogen Atoms 45
    Solvent Atoms 215
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building PHASER
    data collection HKL-2000