X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.8
Temperature 277.0
Details 1.8 M Na/K-phosphate, pH 6.8, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 107.71 α = 90
b = 107.71 β = 90
c = 90.78 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.979 APS 24-ID-E

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50 100.0 0.077 -- -- 9.5 27794 27794 2.0 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.198 38.08 -- 1.34 27794 27729 1393 99.92 0.2423 0.1894 0.1866 0.2423 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.198 2.2768 -- 117 2582 0.3321 0.3833 -- 100.0
X Ray Diffraction 2.2768 2.368 -- 120 2592 0.2335 0.3376 -- 100.0
X Ray Diffraction 2.368 2.4758 -- 142 2594 0.2057 0.2947 -- 100.0
X Ray Diffraction 2.4758 2.6063 -- 159 2586 0.1971 0.2643 -- 100.0
X Ray Diffraction 2.6063 2.7696 -- 154 2594 0.1979 0.2661 -- 100.0
X Ray Diffraction 2.7696 2.9834 -- 127 2610 0.204 0.2679 -- 100.0
X Ray Diffraction 2.9834 3.2835 -- 149 2617 0.189 0.2676 -- 100.0
X Ray Diffraction 3.2835 3.7585 -- 131 2654 0.1691 0.2304 -- 100.0
X Ray Diffraction 3.7585 4.7345 -- 145 2686 0.1484 0.1882 -- 100.0
X Ray Diffraction 4.7345 46.319 -- 149 2821 0.1844 0.2252 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 15.129
f_angle_d 1.082
f_plane_restr 0.005
f_chiral_restr 0.086
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3096
Nucleic Acid Atoms 0
Heterogen Atoms 35
Solvent Atoms 239

Software

Software
Software Name Purpose
HKL-2000 data collection
PHASER phasing
PHENIX refinement version: (phenix.refine: 1.8_1069)
HKL-2000 data reduction
HKL-2000 data scaling