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X-RAY DIFFRACTION
Materials and Methods page
4H9P
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.8
    Temperature 277.0
    Details 1.8 M Na/K-phosphate, pH 6.8, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 107.71 α = 90
    b = 107.71 β = 90
    c = 90.78 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Radiation
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Wavelength List 0.979
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.2
    Resolution(Low) 50
    Number Reflections(All) 27794
    Number Reflections(Observed) 27794
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.077
    Redundancy 9.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.198
    Resolution(Low) 38.08
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 27794
    Number of Reflections(Observed) 27729
    Number of Reflections(R-Free) 1393
    Percent Reflections(Observed) 99.92
    R-Factor(All) 0.2423
    R-Factor(Observed) 0.1894
    R-Work 0.1866
    R-Free 0.2423
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.198
    Shell Resolution(Low) 2.2768
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.3321
    R-Factor(R-Free) 0.3833
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2768
    Shell Resolution(Low) 2.368
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2592
    R-Factor(R-Work) 0.2335
    R-Factor(R-Free) 0.3376
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.368
    Shell Resolution(Low) 2.4758
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.2057
    R-Factor(R-Free) 0.2947
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4758
    Shell Resolution(Low) 2.6063
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2586
    R-Factor(R-Work) 0.1971
    R-Factor(R-Free) 0.2643
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6063
    Shell Resolution(Low) 2.7696
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.1979
    R-Factor(R-Free) 0.2661
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7696
    Shell Resolution(Low) 2.9834
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2610
    R-Factor(R-Work) 0.204
    R-Factor(R-Free) 0.2679
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9834
    Shell Resolution(Low) 3.2835
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.189
    R-Factor(R-Free) 0.2676
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2835
    Shell Resolution(Low) 3.7585
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.1691
    R-Factor(R-Free) 0.2304
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7585
    Shell Resolution(Low) 4.7345
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2686
    R-Factor(R-Work) 0.1484
    R-Factor(R-Free) 0.1882
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7345
    Shell Resolution(Low) 46.319
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2821
    R-Factor(R-Work) 0.1844
    R-Factor(R-Free) 0.2252
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.086
    f_dihedral_angle_d 15.129
    f_angle_d 1.082
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3096
    Nucleic Acid Atoms 0
    Heterogen Atoms 35
    Solvent Atoms 239
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection HKL-2000