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X-RAY DIFFRACTION
Materials and Methods page
4H9O
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 277.0
    Details 1.8 M Na/K-phosphate, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 107.69 α = 90
    b = 107.69 β = 90
    c = 90.77 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Radiation
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Wavelength List 0.979
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.05
    Resolution(Low) 50
    Number Reflections(All) 33889
    Number Reflections(Observed) 33889
    Percent Possible(Observed) 99.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.053
    Resolution(Low) 38.075
    Cut-off Sigma(I) 4.2
    Cut-off Sigma(F) 1.36
    Number of Reflections(all) 33826
    Number of Reflections(Observed) 33826
    Number of Reflections(R-Free) 1710
    Percent Reflections(Observed) 99.74
    R-Factor(All) 0.2245
    R-Factor(Observed) 0.1843
    R-Work 0.1822
    R-Free 0.2245
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -4.596
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -4.596
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 9.1921
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.053
    Shell Resolution(Low) 2.1135
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2563
    R-Factor(R-Work) 0.2285
    R-Factor(R-Free) 0.2819
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1135
    Shell Resolution(Low) 2.1817
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.2117
    R-Factor(R-Free) 0.2656
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1817
    Shell Resolution(Low) 2.2597
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.2017
    R-Factor(R-Free) 0.2445
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2597
    Shell Resolution(Low) 2.3501
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.2092
    R-Factor(R-Free) 0.255
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3501
    Shell Resolution(Low) 2.4571
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2666
    R-Factor(R-Work) 0.1951
    R-Factor(R-Free) 0.2638
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4571
    Shell Resolution(Low) 2.5866
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.2013
    R-Factor(R-Free) 0.2558
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5866
    Shell Resolution(Low) 2.7486
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.1988
    R-Factor(R-Free) 0.2315
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7486
    Shell Resolution(Low) 2.9608
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2683
    R-Factor(R-Work) 0.1878
    R-Factor(R-Free) 0.237
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9608
    Shell Resolution(Low) 3.2586
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.1896
    R-Factor(R-Free) 0.2464
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2586
    Shell Resolution(Low) 3.7297
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.174
    R-Factor(R-Free) 0.1957
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7297
    Shell Resolution(Low) 4.6977
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.1462
    R-Factor(R-Free) 0.1785
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6977
    Shell Resolution(Low) 38.075
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2870
    R-Factor(R-Work) 0.1844
    R-Factor(R-Free) 0.2347
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.067
    f_dihedral_angle_d 15.322
    f_angle_d 1.005
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3086
    Nucleic Acid Atoms 0
    Heterogen Atoms 50
    Solvent Atoms 224
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building PHASER
    data collection HKL-2000