X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 277.0
Details 1.8 M Na/K-phosphate, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 107.46 α = 90
b = 107.46 β = 90
c = 90.48 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.979 NSLS X29A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 50 99.9 -- -- -- -- 39270 39270 2.0 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.95 48.058 5.1 1.36 -- 39145 1989 99.93 0.2087 0.19 0.189 0.2087 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.95 1.9988 -- 147 2596 0.2268 0.2576 -- 100.0
X Ray Diffraction 1.9988 2.0528 -- 125 2615 0.2148 0.2663 -- 100.0
X Ray Diffraction 2.0528 2.1132 -- 143 2614 0.2017 0.2379 -- 100.0
X Ray Diffraction 2.1132 2.1814 -- 145 2610 0.196 0.2124 -- 100.0
X Ray Diffraction 2.1814 2.2594 -- 147 2602 0.1958 0.2418 -- 100.0
X Ray Diffraction 2.2594 2.3498 -- 140 2629 0.2009 0.2499 -- 100.0
X Ray Diffraction 2.3498 2.4568 -- 146 2638 0.1935 0.2478 -- 100.0
X Ray Diffraction 2.4568 2.5863 -- 139 2641 0.1964 0.2189 -- 100.0
X Ray Diffraction 2.5863 2.7483 -- 116 2665 0.1991 0.2159 -- 100.0
X Ray Diffraction 2.7483 2.9605 -- 141 2644 0.202 0.2283 -- 100.0
X Ray Diffraction 2.9605 3.2584 -- 152 2658 0.1992 0.2122 -- 100.0
X Ray Diffraction 3.2584 3.7297 -- 147 2678 0.1739 0.2071 -- 100.0
X Ray Diffraction 3.7297 4.6984 -- 166 2706 0.156 0.1526 -- 100.0
X Ray Diffraction 4.6984 48.058 -- 135 2860 0.1995 0.2161 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 0.877
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.877
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.1144
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.065
f_dihedral_angle_d 15.876
f_angle_d 0.969
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3093
Nucleic Acid Atoms 0
Heterogen Atoms 45
Solvent Atoms 355

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.7.2_869) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.2_869) refinement
PHASER model building
HKL-2000 data collection