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X-RAY DIFFRACTION
Materials and Methods page
4H8Q
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.25
    Temperature 293.0
    Details 5% PEG 3000, 0.2 M Zn acetate and 0.1 M sodium acetate pH 5.25, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 109.09 α = 90
    b = 109.09 β = 90
    c = 109.09 γ = 90
     
    Space Group
    Space Group Name:    I 2 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 325 mm CCD
    Collection Date 2012-06-12
     
    Diffraction Radiation
    Monochromator Double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL9-2
    Wavelength List 1
    Site SSRL
    Beamline BL9-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.49
    Resolution(Low) 38.57
    Number Reflections(Observed) 35031
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.073
    Redundancy 44.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.7
    Resolution(Low) 38.569
    Cut-off Sigma(F) 1.36
    Number of Reflections(Observed) 23875
    Number of Reflections(R-Free) 1362
    Percent Reflections(Observed) 99.97
    R-Factor(Observed) 0.1909
    R-Work 0.1898
    R-Free 0.2083
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7004
    Shell Resolution(Low) 1.7612
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2234
    R-Factor(R-Work) 0.2024
    R-Factor(R-Free) 0.2156
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7612
    Shell Resolution(Low) 1.8317
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2218
    R-Factor(R-Work) 0.2038
    R-Factor(R-Free) 0.2722
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8317
    Shell Resolution(Low) 1.915
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2242
    R-Factor(R-Work) 0.1931
    R-Factor(R-Free) 0.1997
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.915
    Shell Resolution(Low) 2.016
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2236
    R-Factor(R-Work) 0.1907
    R-Factor(R-Free) 0.1885
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.016
    Shell Resolution(Low) 2.1423
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2246
    R-Factor(R-Work) 0.1865
    R-Factor(R-Free) 0.2374
    Percent Reflections(Observed) 1.01
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1423
    Shell Resolution(Low) 2.3077
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2217
    R-Factor(R-Work) 0.2009
    R-Factor(R-Free) 0.2315
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3077
    Shell Resolution(Low) 2.5399
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2264
    R-Factor(R-Work) 0.2115
    R-Factor(R-Free) 0.2059
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5399
    Shell Resolution(Low) 2.9073
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2247
    R-Factor(R-Work) 0.2016
    R-Factor(R-Free) 0.2188
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9073
    Shell Resolution(Low) 3.6624
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2272
    R-Factor(R-Work) 0.1892
    R-Factor(R-Free) 0.2308
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6624
    Shell Resolution(Low) 38.579
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2337
    R-Factor(R-Work) 0.1733
    R-Factor(R-Free) 0.1731
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.069
    f_dihedral_angle_d 15.706
    f_angle_d 1.056
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 957
    Nucleic Acid Atoms 0
    Heterogen Atoms 44
    Solvent Atoms 130
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Web-ice
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    data collection Web-ice