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X-RAY DIFFRACTION
Materials and Methods page
4H8P
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.5
    Temperature 294.0
    Details 10% PEG 3000, 0.2 M Zn acetate and 0.1 M sodium acetate pH 4.5, VAPOR DIFFUSION, HANGING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 109.02 α = 90
    b = 109.02 β = 90
    c = 109.02 γ = 90
     
    Space Group
    Space Group Name:    I 2 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2012-05-19
     
    Diffraction Radiation
    Monochromator Side scattering I-beam bent single crystal; asymmetric cut 4.9650 deg
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL7-1
    Wavelength List 0.98
    Site SSRL
    Beamline BL7-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.05
    Resolution(Low) 54.51
    Number Reflections(Observed) 13751
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.148
    Redundancy 7.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.05
    Resolution(Low) 34.475
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 13748
    Number of Reflections(R-Free) 1381
    Percent Reflections(Observed) 99.58
    R-Factor(Observed) 0.1982
    R-Work 0.1955
    R-Free 0.2234
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.05
    Shell Resolution(Low) 2.1181
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1213
    R-Factor(R-Work) 0.1853
    R-Factor(R-Free) 0.2129
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1181
    Shell Resolution(Low) 2.2029
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1245
    R-Factor(R-Work) 0.1921
    R-Factor(R-Free) 0.2182
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2029
    Shell Resolution(Low) 2.3031
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1227
    R-Factor(R-Work) 0.2007
    R-Factor(R-Free) 0.2441
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3031
    Shell Resolution(Low) 2.4245
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1229
    R-Factor(R-Work) 0.2124
    R-Factor(R-Free) 0.2601
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4245
    Shell Resolution(Low) 2.5764
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1209
    R-Factor(R-Work) 0.2126
    R-Factor(R-Free) 0.2831
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5764
    Shell Resolution(Low) 2.7752
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1248
    R-Factor(R-Work) 0.2262
    R-Factor(R-Free) 0.2671
    Percent Reflections(Observed) 1.01
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7752
    Shell Resolution(Low) 3.0543
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1224
    R-Factor(R-Work) 0.2115
    R-Factor(R-Free) 0.2324
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0543
    Shell Resolution(Low) 3.4959
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1259
    R-Factor(R-Work) 0.1982
    R-Factor(R-Free) 0.2138
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4959
    Shell Resolution(Low) 4.4031
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1248
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.2179
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4031
    Shell Resolution(Low) 34.48
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1265
    R-Factor(R-Work) 0.1897
    R-Factor(R-Free) 0.1856
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.067
    f_dihedral_angle_d 16.5
    f_angle_d 1.244
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 950
    Nucleic Acid Atoms 0
    Heterogen Atoms 44
    Solvent Atoms 99
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Web-ice
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution phenix.automr
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building phenix.automr
    data collection Web-ice