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X-RAY DIFFRACTION
Materials and Methods page
4H85
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 7.5
    Temperature 289.0
    Details 14% peg8000, 0.1 M Tris. 1.2 M NaCl, 125mM KCl, 150mM Arg-HCl,20mM MgCl2, 5% glycerol, pH 7.5, VAPOR DIFFUSION, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 127.62 α = 90
    b = 127.62 β = 90
    c = 73.99 γ = 90
     
    Space Group
    Space Group Name:    P 42 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2012-06-14
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 1.0
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.1
    Resolution(Low) 50
    Number Reflections(All) 36479
    Number Reflections(Observed) 36412
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.062
    Redundancy 9.5
     
    High Resolution Shell Details
    Resolution(High) 2.1
    Resolution(Low) 2.14
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.71
    Mean I Over Sigma(Observed) 3.0
    R-Sym I(Observed) 0.646
    Redundancy 9.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.1
    Resolution(Low) 40.357
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 36527
    Number of Reflections(Observed) 36359
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 99.54
    R-Factor(Observed) 0.2006
    R-Work 0.199
    R-Free 0.2276
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.5214
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.5214
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.0428
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0938
    Shell Resolution(Low) 2.1462
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2321
    R-Factor(R-Work) 0.2252
    R-Factor(R-Free) 0.2849
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1462
    Shell Resolution(Low) 2.2042
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2435
    R-Factor(R-Work) 0.2065
    R-Factor(R-Free) 0.2506
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2042
    Shell Resolution(Low) 2.269
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2424
    R-Factor(R-Work) 0.2038
    R-Factor(R-Free) 0.2395
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.269
    Shell Resolution(Low) 2.3423
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2406
    R-Factor(R-Work) 0.1886
    R-Factor(R-Free) 0.2162
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3423
    Shell Resolution(Low) 2.426
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2419
    R-Factor(R-Work) 0.1845
    R-Factor(R-Free) 0.1935
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.426
    Shell Resolution(Low) 2.5231
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2439
    R-Factor(R-Work) 0.1862
    R-Factor(R-Free) 0.237
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5231
    Shell Resolution(Low) 2.6379
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2465
    R-Factor(R-Work) 0.1951
    R-Factor(R-Free) 0.2416
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6379
    Shell Resolution(Low) 2.777
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2449
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.2197
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.777
    Shell Resolution(Low) 2.9509
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2454
    R-Factor(R-Work) 0.2114
    R-Factor(R-Free) 0.2472
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9509
    Shell Resolution(Low) 3.1786
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2436
    R-Factor(R-Work) 0.2102
    R-Factor(R-Free) 0.2436
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1786
    Shell Resolution(Low) 3.4984
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2483
    R-Factor(R-Work) 0.2022
    R-Factor(R-Free) 0.2317
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4984
    Shell Resolution(Low) 4.0042
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2492
    R-Factor(R-Work) 0.1983
    R-Factor(R-Free) 0.2176
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0042
    Shell Resolution(Low) 5.0433
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2522
    R-Factor(R-Work) 0.1725
    R-Factor(R-Free) 0.1918
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0433
    Shell Resolution(Low) 40.3641
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.2194
    R-Factor(R-Free) 0.2534
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.071
    f_dihedral_angle_d 14.55
    f_angle_d 1.098
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2449
    Nucleic Acid Atoms 0
    Heterogen Atoms 38
    Solvent Atoms 101
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution PHENIX (phenix.refine: 1.7.1_743)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.refine: 1.7.1_743)
    data collection HKL-3000