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X-RAY DIFFRACTION
Materials and Methods page
4H7Z
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 291.15
    Details 100 mM Tris, 1 mM DTT, 10% DMSO, 12% PEG 8000 , pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 291.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 90.39 α = 90
    b = 64.75 β = 95.6
    c = 70.76 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 113.15
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details mirror
    Collection Date 2012-09-15
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.68
    Resolution(Low) 30
    Number Reflections(All) 45941
    Number Reflections(Observed) 45941
    Percent Possible(Observed) 99.2
    R Merge I(Observed) 0.07
    B(Isotropic) From Wilson Plot 17.7
    Redundancy 2.9
     
    High Resolution Shell Details
    Resolution(High) 1.68
    Resolution(Low) 1.77
    Percent Possible(All) 99.8
    R Merge I(Observed) 0.0482
    Mean I Over Sigma(Observed) 2.1
    Redundancy 2.8
    Number Unique Reflections(All) 6709
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.68
    Resolution(Low) 29.415
    Cut-off Sigma(F) 1.24
    Number of Reflections(Observed) 45941
    Number of Reflections(R-Free) 2320
    Percent Reflections(Observed) 95.42
    R-Factor(Observed) 0.1587
    R-Work 0.157
    R-Free 0.1911
    R-Free Selection Details Random, 5.0
     
    Temperature Factor Modeling
    Isotropic Thermal Model isotropic
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.68
    Shell Resolution(Low) 1.6991
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.2703
    R-Factor(R-Free) 0.2678
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6991
    Shell Resolution(Low) 1.7191
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.2665
    R-Factor(R-Free) 0.3019
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7191
    Shell Resolution(Low) 1.74
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2763
    R-Factor(R-Work) 0.2494
    R-Factor(R-Free) 0.2598
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.74
    Shell Resolution(Low) 1.7621
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.2498
    R-Factor(R-Free) 0.3081
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7621
    Shell Resolution(Low) 1.7852
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2733
    R-Factor(R-Work) 0.2385
    R-Factor(R-Free) 0.2797
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7852
    Shell Resolution(Low) 1.8097
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.219
    R-Factor(R-Free) 0.272
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8097
    Shell Resolution(Low) 1.8355
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.212
    R-Factor(R-Free) 0.239
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8355
    Shell Resolution(Low) 1.8629
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2759
    R-Factor(R-Work) 0.1914
    R-Factor(R-Free) 0.2228
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8629
    Shell Resolution(Low) 1.892
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2741
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.2195
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.892
    Shell Resolution(Low) 1.9231
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2826
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.2203
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9231
    Shell Resolution(Low) 1.9562
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 2663
    R-Factor(R-Work) 0.1726
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9562
    Shell Resolution(Low) 1.9918
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2803
    R-Factor(R-Work) 0.1695
    R-Factor(R-Free) 0.1936
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9918
    Shell Resolution(Low) 2.0301
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2754
    R-Factor(R-Work) 0.1552
    R-Factor(R-Free) 0.1805
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0301
    Shell Resolution(Low) 2.0715
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2813
    R-Factor(R-Work) 0.1513
    R-Factor(R-Free) 0.1891
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0715
    Shell Resolution(Low) 2.1165
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.1461
    R-Factor(R-Free) 0.1822
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1165
    Shell Resolution(Low) 2.1658
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2791
    R-Factor(R-Work) 0.139
    R-Factor(R-Free) 0.1739
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1658
    Shell Resolution(Low) 2.2199
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2828
    R-Factor(R-Work) 0.1391
    R-Factor(R-Free) 0.1937
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2199
    Shell Resolution(Low) 2.2799
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.1421
    R-Factor(R-Free) 0.1594
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2799
    Shell Resolution(Low) 2.347
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2784
    R-Factor(R-Work) 0.1361
    R-Factor(R-Free) 0.149
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.347
    Shell Resolution(Low) 2.4227
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2813
    R-Factor(R-Work) 0.1389
    R-Factor(R-Free) 0.1817
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4227
    Shell Resolution(Low) 2.5092
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2745
    R-Factor(R-Work) 0.1421
    R-Factor(R-Free) 0.211
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5092
    Shell Resolution(Low) 2.6096
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2766
    R-Factor(R-Work) 0.1495
    R-Factor(R-Free) 0.182
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6096
    Shell Resolution(Low) 2.7283
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2796
    R-Factor(R-Work) 0.1367
    R-Factor(R-Free) 0.186
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7283
    Shell Resolution(Low) 2.872
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2717
    R-Factor(R-Work) 0.1482
    R-Factor(R-Free) 0.1818
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.872
    Shell Resolution(Low) 3.0518
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2810
    R-Factor(R-Work) 0.1381
    R-Factor(R-Free) 0.1674
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0518
    Shell Resolution(Low) 3.2872
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2760
    R-Factor(R-Work) 0.1434
    R-Factor(R-Free) 0.1849
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2872
    Shell Resolution(Low) 3.6174
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2774
    R-Factor(R-Work) 0.1424
    R-Factor(R-Free) 0.2034
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6174
    Shell Resolution(Low) 4.1396
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 2713
    R-Factor(R-Work) 0.131
    R-Factor(R-Free) 0.169
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1396
    Shell Resolution(Low) 5.2108
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.1464
    R-Factor(R-Free) 0.1782
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2108
    Shell Resolution(Low) 29.415
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2742
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.1626
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.131
    f_dihedral_angle_d 13.287
    f_angle_d 1.75
    f_bond_d 0.019
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2798
    Nucleic Acid Atoms 0
    Heterogen Atoms 30
    Solvent Atoms 318
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building Phaser
    data collection MAR345dtb