X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 291.15
Details 100 mM Tris, 1 mM DTT, 10% DMSO, 12% PEG 8000 , pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 291.15K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 90.39 α = 90
b = 64.75 β = 95.6
c = 70.76 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 113.15
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD mirror 2012-09-15
Diffraction Radiation
Monochromator Protocol
double crystal monochromator SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 0.91841 BESSY 14.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.68 30 99.2 0.07 -- -- 2.9 45941 45941 -- -- 17.7
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.68 1.77 99.8 0.0482 -- 2.1 2.8 6709

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.68 29.415 -- 1.24 -- 45941 2320 95.42 -- 0.1587 0.157 0.1911 Random, 5.0
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.68 1.6991 -- 150 2722 0.2703 0.2678 -- 94.0
X Ray Diffraction 1.6991 1.7191 -- 152 2642 0.2665 0.3019 -- 94.0
X Ray Diffraction 1.7191 1.74 -- 166 2763 0.2494 0.2598 -- 95.0
X Ray Diffraction 1.74 1.7621 -- 145 2662 0.2498 0.3081 -- 94.0
X Ray Diffraction 1.7621 1.7852 -- 157 2733 0.2385 0.2797 -- 94.0
X Ray Diffraction 1.7852 1.8097 -- 160 2720 0.219 0.272 -- 95.0
X Ray Diffraction 1.8097 1.8355 -- 155 2712 0.212 0.239 -- 95.0
X Ray Diffraction 1.8355 1.8629 -- 125 2759 0.1914 0.2228 -- 95.0
X Ray Diffraction 1.8629 1.892 -- 145 2741 0.1783 0.2195 -- 95.0
X Ray Diffraction 1.892 1.9231 -- 143 2826 0.184 0.2203 -- 96.0
X Ray Diffraction 1.9231 1.9562 -- 175 2663 0.1726 0.2054 -- 95.0
X Ray Diffraction 1.9562 1.9918 -- 132 2803 0.1695 0.1936 -- 96.0
X Ray Diffraction 1.9918 2.0301 -- 142 2754 0.1552 0.1805 -- 96.0
X Ray Diffraction 2.0301 2.0715 -- 127 2813 0.1513 0.1891 -- 96.0
X Ray Diffraction 2.0715 2.1165 -- 146 2703 0.1461 0.1822 -- 96.0
X Ray Diffraction 2.1165 2.1658 -- 153 2791 0.139 0.1739 -- 96.0
X Ray Diffraction 2.1658 2.2199 -- 115 2828 0.1391 0.1937 -- 96.0
X Ray Diffraction 2.2199 2.2799 -- 169 2705 0.1421 0.1594 -- 96.0
X Ray Diffraction 2.2799 2.347 -- 129 2784 0.1361 0.149 -- 96.0
X Ray Diffraction 2.347 2.4227 -- 141 2813 0.1389 0.1817 -- 96.0
X Ray Diffraction 2.4227 2.5092 -- 150 2745 0.1421 0.211 -- 96.0
X Ray Diffraction 2.5092 2.6096 -- 132 2766 0.1495 0.182 -- 96.0
X Ray Diffraction 2.6096 2.7283 -- 152 2796 0.1367 0.186 -- 96.0
X Ray Diffraction 2.7283 2.872 -- 147 2717 0.1482 0.1818 -- 96.0
X Ray Diffraction 2.872 3.0518 -- 135 2810 0.1381 0.1674 -- 96.0
X Ray Diffraction 3.0518 3.2872 -- 146 2760 0.1434 0.1849 -- 96.0
X Ray Diffraction 3.2872 3.6174 -- 127 2774 0.1424 0.2034 -- 95.0
X Ray Diffraction 3.6174 4.1396 -- 172 2713 0.131 0.169 -- 95.0
X Ray Diffraction 4.1396 5.2108 -- 153 2700 0.1464 0.1782 -- 95.0
X Ray Diffraction 5.2108 29.415 -- 138 2742 0.1738 0.1626 -- 94.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model isotropic
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.009
f_chiral_restr 0.131
f_dihedral_angle_d 13.287
f_angle_d 1.75
f_bond_d 0.019
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2798
Nucleic Acid Atoms 0
Heterogen Atoms 30
Solvent Atoms 318

Software

Computing
Computing Package Purpose
MAR345dtb Data Collection
MOSFLM Data Reduction (intensity integration)
SCALA Data Reduction (data scaling)
Phaser Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
Phaser model building
MAR345dtb data collection