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X-RAY DIFFRACTION
Materials and Methods page
4H7Y
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 6
    Temperature 291.0
    Details 20% PEG 3350, 100 mM MES, 250 mM KCl, pH 6.0, VAPOR DIFFUSION, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 79.5 α = 90
    b = 80.25 β = 90
    c = 141.28 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type DECTRIS PILATUS 6M
    Collection Date 2011-11-11
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I03
    Wavelength List 0.9763
    Site DIAMOND
    Beamline I03
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.8
    Resolution(Low) 28.5
    Number Reflections(All) 81073
    Number Reflections(Observed) 80100
    Percent Possible(Observed) 98.8
    R Merge I(Observed) 0.036
    B(Isotropic) From Wilson Plot 29.5
    Redundancy 4.0
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.9
    Percent Possible(All) 98.6
    R Merge I(Observed) 0.572
    Redundancy 3.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.8
    Resolution(Low) 28.5
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 81073
    Number of Reflections(Observed) 80100
    Number of Reflections(R-Free) 1926
    Percent Reflections(Observed) 98.6
    R-Factor(All) 0.1992
    R-Factor(Observed) 0.1992
    R-Work 0.1986
    R-Free 0.2257
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -7.2132
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.3327
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.8805
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8001
    Shell Resolution(Low) 1.8451
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 4878
    R-Factor(R-Work) 0.3151
    R-Factor(R-Free) 0.3802
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8451
    Shell Resolution(Low) 1.8949
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 5081
    R-Factor(R-Work) 0.2784
    R-Factor(R-Free) 0.3605
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8949
    Shell Resolution(Low) 1.9507
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 5256
    R-Factor(R-Work) 0.2588
    R-Factor(R-Free) 0.2811
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9507
    Shell Resolution(Low) 2.0136
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 5408
    R-Factor(R-Work) 0.2353
    R-Factor(R-Free) 0.2623
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0136
    Shell Resolution(Low) 2.0856
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 5552
    R-Factor(R-Work) 0.2259
    R-Factor(R-Free) 0.3137
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0856
    Shell Resolution(Low) 2.1691
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 5641
    R-Factor(R-Work) 0.2075
    R-Factor(R-Free) 0.2646
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1691
    Shell Resolution(Low) 2.2677
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 5662
    R-Factor(R-Work) 0.2057
    R-Factor(R-Free) 0.2423
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2677
    Shell Resolution(Low) 2.3872
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 5686
    R-Factor(R-Work) 0.1992
    R-Factor(R-Free) 0.2754
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3872
    Shell Resolution(Low) 2.5367
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 5807
    R-Factor(R-Work) 0.196
    R-Factor(R-Free) 0.2302
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5367
    Shell Resolution(Low) 2.7324
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 5817
    R-Factor(R-Work) 0.1927
    R-Factor(R-Free) 0.2572
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7324
    Shell Resolution(Low) 3.0071
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5845
    R-Factor(R-Work) 0.2009
    R-Factor(R-Free) 0.2098
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0071
    Shell Resolution(Low) 3.4417
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 5826
    R-Factor(R-Work) 0.193
    R-Factor(R-Free) 0.2143
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4417
    Shell Resolution(Low) 4.3337
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 5809
    R-Factor(R-Work) 0.1736
    R-Factor(R-Free) 0.1766
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3337
    Shell Resolution(Low) 28.5141
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 5906
    R-Factor(R-Work) 0.194
    R-Factor(R-Free) 0.2117
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.057
    f_dihedral_angle_d 15.211
    f_angle_d 0.936
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4444
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 503
     
     
  •   Software and Computing Hide
    Computing
    Data Collection GDA
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHENIX (phenix.refine: 1.7.3_928)
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHENIX version: (phenix.refine: 1.7.3_928)
    data collection GDA