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X-RAY DIFFRACTION
Materials and Methods page
4H7X
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 6
    Temperature 291.0
    Details 20% PEG 3350, 100 mM MES, 250 mM KCl, pH 6.0, VAPOR DIFFUSION, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 79.49 α = 90
    b = 79.49 β = 90
    c = 137.68 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2012-02-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04
    Wavelength List 0.9497
    Site DIAMOND
    Beamline I04
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.6
    Resolution(Low) 39.7
    Number Reflections(All) 14021
    Number Reflections(Observed) 14021
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.156
    B(Isotropic) From Wilson Plot 35.9
    Redundancy 10.7
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.66
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.599
    Redundancy 5.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.6
    Resolution(Low) 39.7
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 14021
    Number of Reflections(Observed) 14021
    Number of Reflections(R-Free) 1399
    Percent Reflections(Observed) 99.9
    R-Factor(All) 0.1975
    R-Factor(Observed) 0.1975
    R-Work 0.1928
    R-Free 0.24
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.808
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.808
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.616
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.606
    Shell Resolution(Low) 2.6991
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1218
    R-Factor(R-Work) 0.2119
    R-Factor(R-Free) 0.3072
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6991
    Shell Resolution(Low) 2.8072
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1218
    R-Factor(R-Work) 0.2108
    R-Factor(R-Free) 0.2688
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8072
    Shell Resolution(Low) 2.9349
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1208
    R-Factor(R-Work) 0.2112
    R-Factor(R-Free) 0.3049
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9349
    Shell Resolution(Low) 3.0896
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1242
    R-Factor(R-Work) 0.2146
    R-Factor(R-Free) 0.298
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0896
    Shell Resolution(Low) 3.2831
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1259
    R-Factor(R-Work) 0.2159
    R-Factor(R-Free) 0.2737
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2831
    Shell Resolution(Low) 3.5364
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1260
    R-Factor(R-Work) 0.1928
    R-Factor(R-Free) 0.2379
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5364
    Shell Resolution(Low) 3.892
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1255
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2287
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.892
    Shell Resolution(Low) 4.4545
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1274
    R-Factor(R-Work) 0.1625
    R-Factor(R-Free) 0.2051
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4545
    Shell Resolution(Low) 5.6097
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1306
    R-Factor(R-Work) 0.1799
    R-Factor(R-Free) 0.2177
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6097
    Shell Resolution(Low) 39.7499
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1382
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.2146
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.066
    f_dihedral_angle_d 15.828
    f_angle_d 1.063
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2186
    Nucleic Acid Atoms 0
    Heterogen Atoms 1
    Solvent Atoms 52
     
     
  •   Software and Computing Hide
    Computing
    Data Collection GDA
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution PHENIX (phenix.refine: 1.7.3_928)
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHENIX version: (phenix.refine: 1.7.3_928)
    data collection GDA