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X-RAY DIFFRACTION
Materials and Methods page
4H6J
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 277.0
    Details 20% PEG 8000, 0.2M MgCl2, 0.1M Tris pH 8.5 , VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 68.84 α = 90
    b = 44.94 β = 96.54
    c = 78.09 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2011-01-10
     
    Diffraction Radiation
    Monochromator CUSTOM
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 17-ID
    Wavelength List 1.0
    Site APS
    Beamline 17-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.52
    Resolution(Low) 38.8
    Number Reflections(All) 35783
    Number Reflections(Observed) 35783
    Percent Possible(Observed) 96.9
    R Merge I(Observed) 0.047
    B(Isotropic) From Wilson Plot 22.7
    Redundancy 6.4
     
    High Resolution Shell Details
    Resolution(High) 1.52
    Resolution(Low) 1.6
    Percent Possible(All) 80.0
    R Merge I(Observed) 0.43
    Mean I Over Sigma(Observed) 3.5
    R-Sym I(Observed) 0.43
    Redundancy 5.0
    Number Unique Reflections(All) 4270
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.52
    Resolution(Low) 38.79
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 35782
    Number of Reflections(Observed) 35782
    Number of Reflections(R-Free) 1776
    Percent Reflections(Observed) 93.7
    R-Factor(Observed) 0.216
    R-Work 0.215
    R-Free 0.248
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 25.0
    Anisotropic B[1][1] 1.86
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 3.77
    Anisotropic B[2][2] 0.16
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.02
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5
    Shell Resolution(Low) 1.59
    Number of Reflections(R-Free) 213
    Number of Reflections(R-Work) 3806
    R-Factor(R-Work) 0.289
    R-Factor(R-Free) 0.335
    R-Free Error 0.023
    Percent Reflections(Observed) 63.5
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 3.11
    c_scbond_it 2.07
    c_mcangle_it 2.13
    c_mcbond_it 1.33
    c_improper_angle_d 0.58
    c_bond_d 0.004
    c_angle_deg 0.8
    c_dihedral_angle_d 19.1
     
    Coordinate Error
    Luzzati ESD(Observed) 0.2
    Luzzati Sigma A(Observed) 0.15
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.24
    Luzzati Sigma A(R-Free Set) 0.17
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1783
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 154
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) PROCESS
    Data Reduction (data scaling) SCALA
    Structure Solution CNS
    Structure Refinement CNX 2005
     
    Software
    refinement CNX version: 2005
    model building CNS