X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 291.15
Details 100 mM Tris, 1 mM DTT, 10% DMSO, 12% PEG 8000, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 291.15K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 91.04 α = 90
b = 64.8 β = 96.13
c = 70.53 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 113.15
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD mirror 2010-10-21
Diffraction Radiation
Monochromator Protocol
double crystal monochromator SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.2 0.91841 BESSY 14.2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.42 30 96.7 0.043 -- -- 2.8 76898 72492 -- -- 10.92
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.42 1.44 87.2 -- 0.046 -- 2.1 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.42 26.389 -- 0.06 -- 72492 2000 94.28 -- 0.1491 0.1484 0.1744 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.42 1.4556 -- 125 4415 0.1783 0.2276 -- 83.0
X Ray Diffraction 1.4556 1.495 -- 140 4923 0.1593 0.1899 -- 93.0
X Ray Diffraction 1.495 1.5389 -- 142 4999 0.1553 0.1707 -- 94.0
X Ray Diffraction 1.5389 1.5886 -- 143 5047 0.1372 0.177 -- 95.0
X Ray Diffraction 1.5886 1.6454 -- 145 5117 0.1342 0.1848 -- 96.0
X Ray Diffraction 1.6454 1.7112 -- 145 5089 0.1428 0.1687 -- 96.0
X Ray Diffraction 1.7112 1.7891 -- 145 5119 0.1491 0.1815 -- 96.0
X Ray Diffraction 1.7891 1.8834 -- 145 5118 0.1369 0.1631 -- 96.0
X Ray Diffraction 1.8834 2.0014 -- 147 5174 0.142 0.166 -- 96.0
X Ray Diffraction 2.0014 2.1558 -- 146 5155 0.1356 0.1551 -- 97.0
X Ray Diffraction 2.1558 2.3727 -- 146 5132 0.1448 0.1813 -- 96.0
X Ray Diffraction 2.3727 2.7157 -- 145 5125 0.1504 0.1913 -- 96.0
X Ray Diffraction 2.7157 3.4203 -- 145 5116 0.1533 0.1506 -- 95.0
X Ray Diffraction 3.4203 26.3931 -- 141 4963 0.1562 0.1852 -- 91.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.007
f_chiral_restr 0.08
f_dihedral_angle_d 12.954
f_angle_d 1.369
f_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2857
Nucleic Acid Atoms 0
Heterogen Atoms 43
Solvent Atoms 421

Software

Computing
Computing Package Purpose
MAR345dtb Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
Phaser model building
MAR345dtb data collection