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X-RAY DIFFRACTION
Materials and Methods page
4H6E
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 291.15
    Details 100 mM Tris, 1 mM DTT, 10% DMSO, 12% PEG 8000, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 291.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 91.04 α = 90
    b = 64.8 β = 96.13
    c = 70.53 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 113.15
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details mirror
    Collection Date 2010-10-21
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.42
    Resolution(Low) 30
    Number Reflections(All) 76898
    Number Reflections(Observed) 72492
    Percent Possible(Observed) 96.7
    R Merge I(Observed) 0.043
    B(Isotropic) From Wilson Plot 10.92
    Redundancy 2.8
     
    High Resolution Shell Details
    Resolution(High) 1.42
    Resolution(Low) 1.44
    Percent Possible(All) 87.2
    R-Sym I(Observed) 0.046
    Redundancy 2.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.42
    Resolution(Low) 26.389
    Cut-off Sigma(F) 0.06
    Number of Reflections(Observed) 72492
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 94.28
    R-Factor(Observed) 0.1491
    R-Work 0.1484
    R-Free 0.1744
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.42
    Shell Resolution(Low) 1.4556
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 4415
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.2276
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4556
    Shell Resolution(Low) 1.495
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 4923
    R-Factor(R-Work) 0.1593
    R-Factor(R-Free) 0.1899
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.495
    Shell Resolution(Low) 1.5389
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4999
    R-Factor(R-Work) 0.1553
    R-Factor(R-Free) 0.1707
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5389
    Shell Resolution(Low) 1.5886
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 5047
    R-Factor(R-Work) 0.1372
    R-Factor(R-Free) 0.177
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5886
    Shell Resolution(Low) 1.6454
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5117
    R-Factor(R-Work) 0.1342
    R-Factor(R-Free) 0.1848
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6454
    Shell Resolution(Low) 1.7112
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5089
    R-Factor(R-Work) 0.1428
    R-Factor(R-Free) 0.1687
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7112
    Shell Resolution(Low) 1.7891
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5119
    R-Factor(R-Work) 0.1491
    R-Factor(R-Free) 0.1815
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7891
    Shell Resolution(Low) 1.8834
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5118
    R-Factor(R-Work) 0.1369
    R-Factor(R-Free) 0.1631
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8834
    Shell Resolution(Low) 2.0014
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 5174
    R-Factor(R-Work) 0.142
    R-Factor(R-Free) 0.166
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0014
    Shell Resolution(Low) 2.1558
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 5155
    R-Factor(R-Work) 0.1356
    R-Factor(R-Free) 0.1551
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1558
    Shell Resolution(Low) 2.3727
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 5132
    R-Factor(R-Work) 0.1448
    R-Factor(R-Free) 0.1813
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3727
    Shell Resolution(Low) 2.7157
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5125
    R-Factor(R-Work) 0.1504
    R-Factor(R-Free) 0.1913
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7157
    Shell Resolution(Low) 3.4203
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5116
    R-Factor(R-Work) 0.1533
    R-Factor(R-Free) 0.1506
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4203
    Shell Resolution(Low) 26.3931
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4963
    R-Factor(R-Work) 0.1562
    R-Factor(R-Free) 0.1852
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.08
    f_dihedral_angle_d 12.954
    f_angle_d 1.369
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2857
    Nucleic Acid Atoms 0
    Heterogen Atoms 43
    Solvent Atoms 421
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building Phaser
    data collection MAR345dtb