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X-RAY DIFFRACTION
Materials and Methods page
4H3W
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 277.0
    Details 30.0% polyethylene glycol 4000, 0.2M magnesium chloride, 0.1M TRIS pH 8.5, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 38.75 α = 91.64
    b = 65.32 β = 92.35
    c = 78.76 γ = 104.5
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Details Flat mirror (vertical focusing); single crystal Si(111) bent monochromator (horizontal focusing)
    Collection Date 2012-08-02
     
    Diffraction Radiation
    Monochromator single crystal Si(111) bent
    Diffraction Protocol SAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength 0.97885
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.87
    Resolution(Low) 48.32
    Number Reflections(Observed) 53817
    Percent Possible(Observed) 87.2
    R Merge I(Observed) 0.059
    B(Isotropic) From Wilson Plot 30.595
     
    High Resolution Shell Details
    Resolution(High) 1.87
    Resolution(Low) 1.94
    Percent Possible(All) 61.5
    R Merge I(Observed) 0.57
    Mean I Over Sigma(Observed) 1.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.87
    Resolution(Low) 48.317
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 53272
    Number of Reflections(R-Free) 2703
    Percent Reflections(Observed) 86.62
    R-Factor(Observed) 0.1984
    R-Work 0.1963
    R-Free 0.2382
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 42.5108
    Anisotropic B[1][1] -0.56
    Anisotropic B[1][2] 0.85
    Anisotropic B[1][3] -0.47
    Anisotropic B[2][2] 3.15
    Anisotropic B[2][3] 0.1
    Anisotropic B[3][3] -3.19
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.872
    Shell Resolution(Low) 1.921
    Number of Reflections(R-Free) 91
    Number of Reflections(R-Work) 2185
    R-Factor(R-Work) 0.449
    R-Factor(R-Free) 0.489
    Percent Reflections(Observed) 49.82
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_other 0.003
    r_gen_planes_refined 0.007
    r_chiral_restr 0.045
    r_dihedral_angle_4_deg 18.507
    r_dihedral_angle_3_deg 12.165
    r_dihedral_angle_2_deg 32.903
    r_dihedral_angle_1_deg 6.637
    r_angle_other_deg 0.872
    r_angle_refined_deg 1.479
    r_bond_other_d 0.003
    r_bond_refined_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4836
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 393
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution SHELXD,SHARP
    Structure Refinement REFMAC 5.7.0029
     
    Software
    refinement REFMAC5 version: 5.7.0029
    data processing Xscale version: March 15, 2012
    phasing SHARP
    phasing SHELX
    data extraction pdb_extract version: 3.10
    validation MOLPROBITY version: 3beta29