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X-RAY DIFFRACTION
Materials and Methods page
4H3Q
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.5
    Temperature 296.0
    Details 20% PEG1500, 0.1M MIB, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 41.75 α = 90
    b = 58.53 β = 90
    c = 159.15 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PSI PILATUS 2M
    Collection Date 2012-07-31
     
    Diffraction Radiation
    Monochromator SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.0
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.25
    Observed Criterion Sigma(I) 2.25
    Resolution(High) 2.2
    Resolution(Low) 47.15
    Number Reflections(All) 20638
    Number Reflections(Observed) 20375
    Percent Possible(Observed) 99.03
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.279
    Percent Possible(All) 96.49
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2
    Resolution(Low) 47.149
    Cut-off Sigma(F) 1.36
    Number of Reflections(all) 20371
    Number of Reflections(Observed) 20371
    Number of Reflections(R-Free) 1047
    Percent Reflections(Observed) 99.01
    R-Factor(Observed) 0.1839
    R-Work 0.1813
    R-Free 0.2318
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2
    Shell Resolution(Low) 2.3163
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.2602
    R-Factor(R-Free) 0.2974
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3163
    Shell Resolution(Low) 2.4614
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2754
    R-Factor(R-Work) 0.2291
    R-Factor(R-Free) 0.2706
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4614
    Shell Resolution(Low) 2.6514
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.2231
    R-Factor(R-Free) 0.3109
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6514
    Shell Resolution(Low) 2.9182
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.2083
    R-Factor(R-Free) 0.2645
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9182
    Shell Resolution(Low) 3.3404
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2745
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.2474
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3404
    Shell Resolution(Low) 4.2082
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 2800
    R-Factor(R-Work) 0.1561
    R-Factor(R-Free) 0.2118
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2082
    Shell Resolution(Low) 47.1602
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2896
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.1949
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.098
    f_dihedral_angle_d 19.032
    f_angle_d 1.415
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2902
    Nucleic Acid Atoms 0
    Heterogen Atoms 31
    Solvent Atoms 84
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection XDS