X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.5
Temperature 296.0
Details 20% PEG1500, 0.1M MIB, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 296K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 41.75 α = 90
b = 58.53 β = 90
c = 159.15 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL PSI PILATUS 2M -- 2012-07-31
Diffraction Radiation
Monochromator Protocol
SI(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.0 SLS X06DA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 47.15 99.03 -- -- -- -- 20638 20375 2.25 2.25 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.279 96.49 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.2 47.149 -- 1.36 20371 20371 1047 99.01 -- 0.1839 0.1813 0.2318 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2 2.3163 -- 147 2667 0.2602 0.2974 -- 98.0
X Ray Diffraction 2.3163 2.4614 -- 129 2754 0.2291 0.2706 -- 100.0
X Ray Diffraction 2.4614 2.6514 -- 158 2719 0.2231 0.3109 -- 100.0
X Ray Diffraction 2.6514 2.9182 -- 152 2743 0.2083 0.2645 -- 100.0
X Ray Diffraction 2.9182 3.3404 -- 148 2745 0.1919 0.2474 -- 99.0
X Ray Diffraction 3.3404 4.2082 -- 174 2800 0.1561 0.2118 -- 99.0
X Ray Diffraction 4.2082 47.1602 -- 139 2896 0.1613 0.1949 -- 98.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.006
f_chiral_restr 0.098
f_dihedral_angle_d 19.032
f_angle_d 1.415
f_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2902
Nucleic Acid Atoms 0
Heterogen Atoms 31
Solvent Atoms 84

Software

Computing
Computing Package Purpose
XDS Data Collection
XDS Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
PHASER model building
XDS data collection