POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4H3P
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 296.0
    Details 25-30% PEG6000, 0.1M MES, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 41.48 α = 100.93
    b = 58.77 β = 98.96
    c = 79.18 γ = 90.01
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PSI PILATUS 2M
    Collection Date 2012-07-31
     
    Diffraction Radiation
    Monochromator SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.0
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.39
    Observed Criterion Sigma(I) 2.39
    Resolution(High) 2.3
    Resolution(Low) 42.37
    Number Reflections(All) 32220
    Number Reflections(Observed) 30568
    Percent Possible(Observed) 94.9
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.382
    Percent Possible(All) 93.31
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 42.37
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 30560
    Number of Reflections(Observed) 30560
    Number of Reflections(R-Free) 1542
    Percent Reflections(Observed) 94.92
    R-Factor(Observed) 0.1804
    R-Work 0.178
    R-Free 0.2237
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.3745
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2578
    R-Factor(R-Work) 0.2412
    R-Factor(R-Free) 0.3147
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3745
    Shell Resolution(Low) 2.4593
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.2286
    R-Factor(R-Free) 0.2572
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4593
    Shell Resolution(Low) 2.5578
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.2287
    R-Factor(R-Free) 0.3263
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5578
    Shell Resolution(Low) 2.6742
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.2125
    R-Factor(R-Free) 0.2598
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6742
    Shell Resolution(Low) 2.8152
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2657
    R-Factor(R-Work) 0.2123
    R-Factor(R-Free) 0.2948
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8152
    Shell Resolution(Low) 2.9915
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.2025
    R-Factor(R-Free) 0.2822
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9915
    Shell Resolution(Low) 3.2224
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2691
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.2602
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2224
    Shell Resolution(Low) 3.5465
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.1662
    R-Factor(R-Free) 0.2157
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5465
    Shell Resolution(Low) 4.0594
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.1489
    R-Factor(R-Free) 0.1838
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0594
    Shell Resolution(Low) 5.113
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2573
    R-Factor(R-Work) 0.143
    R-Factor(R-Free) 0.1903
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.113
    Shell Resolution(Low) 42.3779
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2586
    R-Factor(R-Work) 0.1766
    R-Factor(R-Free) 0.1858
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.089
    f_dihedral_angle_d 20.508
    f_angle_d 1.354
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5687
    Nucleic Acid Atoms 0
    Heterogen Atoms 62
    Solvent Atoms 177
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection XDS