X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 296.0
Details 25-30% PEG6000, 0.1M MES, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 296K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 41.48 α = 100.93
b = 58.77 β = 98.96
c = 79.18 γ = 90.01
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL PSI PILATUS 2M -- 2012-07-31
Diffraction Radiation
Monochromator Protocol
SI(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.0 SLS X06DA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 42.37 94.9 -- -- -- -- 32220 30568 2.39 2.39 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.3 2.382 93.31 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.3 42.37 -- 1.99 30560 30560 1542 94.92 -- 0.1804 0.178 0.2237 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3 2.3745 -- 129 2578 0.2412 0.3147 -- 93.0
X Ray Diffraction 2.3745 2.4593 -- 132 2621 0.2286 0.2572 -- 93.0
X Ray Diffraction 2.4593 2.5578 -- 153 2631 0.2287 0.3263 -- 95.0
X Ray Diffraction 2.5578 2.6742 -- 139 2678 0.2125 0.2598 -- 96.0
X Ray Diffraction 2.6742 2.8152 -- 133 2657 0.2123 0.2948 -- 95.0
X Ray Diffraction 2.8152 2.9915 -- 145 2667 0.2025 0.2822 -- 96.0
X Ray Diffraction 2.9915 3.2224 -- 116 2691 0.184 0.2602 -- 96.0
X Ray Diffraction 3.2224 3.5465 -- 129 2667 0.1662 0.2157 -- 95.0
X Ray Diffraction 3.5465 4.0594 -- 144 2669 0.1489 0.1838 -- 96.0
X Ray Diffraction 4.0594 5.113 -- 163 2573 0.143 0.1903 -- 94.0
X Ray Diffraction 5.113 42.3779 -- 159 2586 0.1766 0.1858 -- 94.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.007
f_chiral_restr 0.089
f_dihedral_angle_d 20.508
f_angle_d 1.354
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5687
Nucleic Acid Atoms 0
Heterogen Atoms 62
Solvent Atoms 177

Software

Computing
Computing Package Purpose
XDS Data Collection
XDS Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
PHASER model building
XDS data collection