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X-RAY DIFFRACTION
Materials and Methods page
4H35
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 7.5
    Temperature 293.0
    Details 100 mM HEPES, pH 7.5, 1 M sodium acetate, 50 mM cadmium acetate, 5% glycerol, VAPOR DIFFUSION, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.37 α = 90
    b = 108.4 β = 90
    c = 112.86 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type OXFORD ONYX CCD
    Collection Date 2011-10-15
     
    Diffraction Radiation
    Monochromator graphite
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type OTHER
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.9
    Resolution(Low) 20
    Number Reflections(All) 63630
    Number Reflections(Observed) 63630
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.104
    B(Isotropic) From Wilson Plot 18.2
    Redundancy 5.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method UV-RIP
    reflnsShellList 1.9
    Resolution(Low) 14.86
    Cut-off Sigma(F) 1.01
    Number of Reflections(all) 63616
    Number of Reflections(Observed) 63616
    Number of Reflections(R-Free) 3257
    Percent Reflections(Observed) 99.67
    R-Factor(Observed) 0.1585
    R-Work 0.1574
    R-Free 0.1774
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9215
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 3754
    R-Factor(R-Work) 0.2211
    R-Factor(R-Free) 0.2236
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9215
    Shell Resolution(Low) 1.9441
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 3819
    R-Factor(R-Work) 0.2
    R-Factor(R-Free) 0.2374
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9441
    Shell Resolution(Low) 1.9677
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 3837
    R-Factor(R-Work) 0.1917
    R-Factor(R-Free) 0.2338
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9677
    Shell Resolution(Low) 1.9926
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 3867
    R-Factor(R-Work) 0.1822
    R-Factor(R-Free) 0.1985
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9926
    Shell Resolution(Low) 2.0187
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 3849
    R-Factor(R-Work) 0.1841
    R-Factor(R-Free) 0.1942
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0187
    Shell Resolution(Low) 2.0463
    Number of Reflections(R-Free) 216
    Number of Reflections(R-Work) 3858
    R-Factor(R-Work) 0.1832
    R-Factor(R-Free) 0.2408
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0463
    Shell Resolution(Low) 2.0755
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 3815
    R-Factor(R-Work) 0.1873
    R-Factor(R-Free) 0.2165
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0755
    Shell Resolution(Low) 2.1064
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 3880
    R-Factor(R-Work) 0.1638
    R-Factor(R-Free) 0.2037
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1064
    Shell Resolution(Low) 2.1392
    Number of Reflections(R-Free) 229
    Number of Reflections(R-Work) 3798
    R-Factor(R-Work) 0.1598
    R-Factor(R-Free) 0.1829
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1392
    Shell Resolution(Low) 2.1742
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 3909
    R-Factor(R-Work) 0.1568
    R-Factor(R-Free) 0.1709
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1742
    Shell Resolution(Low) 2.2115
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 3818
    R-Factor(R-Work) 0.1535
    R-Factor(R-Free) 0.1832
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2115
    Shell Resolution(Low) 2.2516
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3862
    R-Factor(R-Work) 0.1511
    R-Factor(R-Free) 0.197
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2516
    Shell Resolution(Low) 2.2948
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3862
    R-Factor(R-Work) 0.1499
    R-Factor(R-Free) 0.1669
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2948
    Shell Resolution(Low) 2.3414
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3852
    R-Factor(R-Work) 0.1558
    R-Factor(R-Free) 0.1643
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3414
    Shell Resolution(Low) 2.3921
    Number of Reflections(R-Free) 243
    Number of Reflections(R-Work) 3824
    R-Factor(R-Work) 0.1455
    R-Factor(R-Free) 0.1581
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3921
    Shell Resolution(Low) 2.4475
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 3837
    R-Factor(R-Work) 0.1448
    R-Factor(R-Free) 0.1727
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4475
    Shell Resolution(Low) 2.5085
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 3886
    R-Factor(R-Work) 0.1492
    R-Factor(R-Free) 0.1598
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5085
    Shell Resolution(Low) 2.576
    Number of Reflections(R-Free) 202
    Number of Reflections(R-Work) 3847
    R-Factor(R-Work) 0.1509
    R-Factor(R-Free) 0.1811
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.576
    Shell Resolution(Low) 2.6513
    Number of Reflections(R-Free) 238
    Number of Reflections(R-Work) 3818
    R-Factor(R-Work) 0.1555
    R-Factor(R-Free) 0.1792
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6513
    Shell Resolution(Low) 2.7364
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 3844
    R-Factor(R-Work) 0.1549
    R-Factor(R-Free) 0.1895
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7364
    Shell Resolution(Low) 2.8336
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 3866
    R-Factor(R-Work) 0.1594
    R-Factor(R-Free) 0.1768
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8336
    Shell Resolution(Low) 2.9462
    Number of Reflections(R-Free) 237
    Number of Reflections(R-Work) 3822
    R-Factor(R-Work) 0.163
    R-Factor(R-Free) 0.1842
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9462
    Shell Resolution(Low) 3.0791
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 3859
    R-Factor(R-Work) 0.1577
    R-Factor(R-Free) 0.1626
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0791
    Shell Resolution(Low) 3.2399
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 3839
    R-Factor(R-Work) 0.1594
    R-Factor(R-Free) 0.1821
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2399
    Shell Resolution(Low) 3.4405
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 3862
    R-Factor(R-Work) 0.1612
    R-Factor(R-Free) 0.1708
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4405
    Shell Resolution(Low) 3.7024
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3865
    R-Factor(R-Work) 0.1489
    R-Factor(R-Free) 0.1804
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7024
    Shell Resolution(Low) 4.068
    Number of Reflections(R-Free) 227
    Number of Reflections(R-Work) 3846
    R-Factor(R-Work) 0.1367
    R-Factor(R-Free) 0.1446
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.068
    Shell Resolution(Low) 4.6409
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 3837
    R-Factor(R-Work) 0.1242
    R-Factor(R-Free) 0.14
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6409
    Shell Resolution(Low) 5.789
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3843
    R-Factor(R-Work) 0.1406
    R-Factor(R-Free) 0.1282
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.789
    Shell Resolution(Low) 14.8609
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3803
    R-Factor(R-Work) 0.1687
    R-Factor(R-Free) 0.1932
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.08
    f_dihedral_angle_d 13.266
    f_angle_d 1.107
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4580
    Nucleic Acid Atoms 0
    Heterogen Atoms 8
    Solvent Atoms 315
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrysAllisPro
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution SHELXD
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building SHELXD
    data collection CrysAllisPro