POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4H2C
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 292.0
    Details 0.1M Tris-HCl, 12%(w/v) PEG20000, 0.01M L-Cysteine, pH 8, VAPOR DIFFUSION, HANGING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 84.09 α = 90
    b = 90.08 β = 90
    c = 91.57 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2004-11-04
     
    Diffraction Radiation
    Monochromator monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-3
    Wavelength List 0.93100
    Site ESRF
    Beamline ID14-3
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.7
    Resolution(Low) 16.8
    Number Reflections(Observed) 92087
    Percent Possible(Observed) 99.9
    B(Isotropic) From Wilson Plot 11.4
    Redundancy 7.4
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.79
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.44
    Mean I Over Sigma(Observed) 5.3
    Redundancy 7.4
    Number Unique Reflections(All) 11131
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.7
    Resolution(Low) 16.8
    Cut-off Sigma(F) 1.4
    Number of Reflections(all) 76945
    Number of Reflections(Observed) 76945
    Number of Reflections(R-Free) 3865
    Percent Reflections(Observed) 99.97
    R-Factor(Observed) 0.1435
    R-Work 0.1419
    R-Free 0.173
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7
    Shell Resolution(Low) 1.7207
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.1494
    R-Factor(R-Free) 0.1995
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7207
    Shell Resolution(Low) 1.7425
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2574
    R-Factor(R-Work) 0.1482
    R-Factor(R-Free) 0.1781
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7425
    Shell Resolution(Low) 1.7654
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.147
    R-Factor(R-Free) 0.1959
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7654
    Shell Resolution(Low) 1.7895
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2557
    R-Factor(R-Work) 0.1515
    R-Factor(R-Free) 0.1984
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7895
    Shell Resolution(Low) 1.8151
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.1451
    R-Factor(R-Free) 0.1772
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8151
    Shell Resolution(Low) 1.8421
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2581
    R-Factor(R-Work) 0.149
    R-Factor(R-Free) 0.1766
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8421
    Shell Resolution(Low) 1.8709
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.1508
    R-Factor(R-Free) 0.2092
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8709
    Shell Resolution(Low) 1.9015
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2570
    R-Factor(R-Work) 0.1492
    R-Factor(R-Free) 0.1973
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9015
    Shell Resolution(Low) 1.9343
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.1546
    R-Factor(R-Free) 0.187
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9343
    Shell Resolution(Low) 1.9694
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.1421
    R-Factor(R-Free) 0.1845
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9694
    Shell Resolution(Low) 2.0072
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2620
    R-Factor(R-Work) 0.1497
    R-Factor(R-Free) 0.195
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0072
    Shell Resolution(Low) 2.0481
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2570
    R-Factor(R-Work) 0.136
    R-Factor(R-Free) 0.1727
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0481
    Shell Resolution(Low) 2.0925
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2576
    R-Factor(R-Work) 0.1405
    R-Factor(R-Free) 0.183
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0925
    Shell Resolution(Low) 2.1411
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.1418
    R-Factor(R-Free) 0.1504
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1411
    Shell Resolution(Low) 2.1946
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.1444
    R-Factor(R-Free) 0.173
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1946
    Shell Resolution(Low) 2.2538
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.1451
    R-Factor(R-Free) 0.174
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2538
    Shell Resolution(Low) 2.3199
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2574
    R-Factor(R-Work) 0.1478
    R-Factor(R-Free) 0.1919
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3199
    Shell Resolution(Low) 2.3946
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.1404
    R-Factor(R-Free) 0.1876
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3946
    Shell Resolution(Low) 2.4799
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.1429
    R-Factor(R-Free) 0.1789
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4799
    Shell Resolution(Low) 2.5789
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2593
    R-Factor(R-Work) 0.1434
    R-Factor(R-Free) 0.1681
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5789
    Shell Resolution(Low) 2.6958
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.1472
    R-Factor(R-Free) 0.1665
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6958
    Shell Resolution(Low) 2.8373
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.144
    R-Factor(R-Free) 0.1842
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8373
    Shell Resolution(Low) 3.0141
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2628
    R-Factor(R-Work) 0.147
    R-Factor(R-Free) 0.1764
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0141
    Shell Resolution(Low) 3.2452
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.1403
    R-Factor(R-Free) 0.1558
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2452
    Shell Resolution(Low) 3.569
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.1326
    R-Factor(R-Free) 0.1646
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.569
    Shell Resolution(Low) 4.0789
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2657
    R-Factor(R-Work) 0.1279
    R-Factor(R-Free) 0.153
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0789
    Shell Resolution(Low) 5.1147
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 2670
    R-Factor(R-Work) 0.122
    R-Factor(R-Free) 0.1553
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1147
    Shell Resolution(Low) 16.7656
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2794
    R-Factor(R-Work) 0.1608
    R-Factor(R-Free) 0.1708
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.11
    f_dihedral_angle_d 13.21
    f_angle_d 1.43
    f_bond_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4483
    Nucleic Acid Atoms 0
    Heterogen Atoms 31
    Solvent Atoms 852
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution Phaser-MR
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building Phaser-MR
    data collection ADSC version: Quantum