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X-RAY DIFFRACTION
Materials and Methods page
4H27
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 293.0
    Details 0.8 M ammonium sulfate, 0.1 M Tris-HCl, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 158.5 α = 90
    b = 158.5 β = 90
    c = 59.45 γ = 90
     
    Space Group
    Space Group Name:    I 4 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-02-28
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE BL-17A
    Wavelength List 1
    Site PHOTON FACTORY
    Beamline BL-17A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.3
    Resolution(Low) 30
    Number Reflections(Observed) 92171
    Percent Possible(Observed) 99.9
     
    High Resolution Shell Details
    Resolution(High) 1.3
    Resolution(Low) 1.35
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.3
    Resolution(Low) 30.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 92171
    Number of Reflections(Observed) 87520
    Number of Reflections(R-Free) 4608
    Percent Reflections(Observed) 99.76
    R-Factor(Observed) 0.14567
    R-Work 0.14446
    R-Free 0.16832
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 20.933
    Anisotropic B[1][1] -0.44
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.44
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.87
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3
    Shell Resolution(Low) 1.334
    Number of Reflections(R-Free) 334
    Number of Reflections(R-Work) 6360
    R-Factor(R-Work) 0.226
    R-Factor(R-Free) 0.246
    Percent Reflections(Observed) 99.23
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_rigid_bond_restr 1.728
    r_scangle_it 5.757
    r_scbond_it 3.84
    r_mcangle_it 2.688
    r_mcbond_it 1.695
    r_gen_planes_refined 0.009
    r_chiral_restr 0.091
    r_dihedral_angle_4_deg 20.721
    r_dihedral_angle_3_deg 11.445
    r_dihedral_angle_2_deg 34.113
    r_dihedral_angle_1_deg 5.277
    r_angle_refined_deg 1.545
    r_bond_refined_d 0.014
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2369
    Nucleic Acid Atoms 0
    Heterogen Atoms 15
    Solvent Atoms 462
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution AMoRE
    Structure Refinement REFMAC 5.5.0109
     
    Software
    refinement REFMAC version: 5.5.0109
    model building AMoRE
    data collection HKL-2000