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X-RAY DIFFRACTION
Materials and Methods page
4H1I
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 298.0
    Details Protein at 5mg/ml, 30% PEG 1500, 15mM ammonium sulfate, 20mM 2-mercaptoethanol, 3% w/v 1,5-Diaminopentane dihydrochloride, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 157.85 α = 90
    b = 94.93 β = 122.75
    c = 131.44 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 173
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MAR scanner 345 mm plate
    Collection Date 2011-05-08
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.34
    Observed Criterion Sigma(I) 1.34
    Resolution(High) 3.1
    Resolution(Low) 19.9
    Number Reflections(All) 29851
    Number Reflections(Observed) 29732
    Percent Possible(Observed) 99.6
    Redundancy 6.2
     
    High Resolution Shell Details
    Resolution(High) 3.1
    Resolution(Low) 3.2
    Percent Possible(All) 98.6
    Mean I Over Sigma(Observed) 2.05
    Redundancy 5.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.095
    Resolution(Low) 19.888
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 29851
    Number of Reflections(Observed) 29732
    Number of Reflections(R-Free) 1507
    Percent Reflections(Observed) 99.6
    R-Factor(Observed) 0.2344
    R-Work 0.2317
    R-Free 0.2849
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -5.8616
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -1.2716
    Anisotropic B[2][2] 6.6666
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.8914
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0954
    Shell Resolution(Low) 3.1949
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2513
    R-Factor(R-Work) 0.3319
    R-Factor(R-Free) 0.3615
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1949
    Shell Resolution(Low) 3.3086
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2540
    R-Factor(R-Work) 0.2832
    R-Factor(R-Free) 0.3704
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3086
    Shell Resolution(Low) 3.4404
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2577
    R-Factor(R-Work) 0.2625
    R-Factor(R-Free) 0.3229
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4404
    Shell Resolution(Low) 3.5961
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.2322
    R-Factor(R-Free) 0.2866
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5961
    Shell Resolution(Low) 3.7845
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2577
    R-Factor(R-Work) 0.2208
    R-Factor(R-Free) 0.2752
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7845
    Shell Resolution(Low) 4.0197
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2570
    R-Factor(R-Work) 0.2251
    R-Factor(R-Free) 0.3057
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0197
    Shell Resolution(Low) 4.3272
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2541
    R-Factor(R-Work) 0.2013
    R-Factor(R-Free) 0.2336
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3272
    Shell Resolution(Low) 4.7572
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.2284
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7572
    Shell Resolution(Low) 5.4333
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2569
    R-Factor(R-Work) 0.2128
    R-Factor(R-Free) 0.3098
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4333
    Shell Resolution(Low) 6.7996
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.2552
    R-Factor(R-Free) 0.3007
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.7996
    Shell Resolution(Low) 19.8883
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.2349
    R-Factor(R-Free) 0.2667
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.056
    f_dihedral_angle_d 14.306
    f_angle_d 0.77
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9080
    Nucleic Acid Atoms 0
    Heterogen Atoms 20
    Solvent Atoms 21
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building Phaser
    data collection MAR345dtb